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Method for testing sheet resistance in preparation process of selective transmission electrode battery

A technology of emitter electrode and preparation process, applied in the direction of measuring resistance/reactance/impedance, measuring device, measuring electrical variables, etc., can solve problems such as test error, difficulty in process adjustment and optimization, and easy pressure of probes to grid lines, etc. Accurately identify test points, save test time, and simplify the test process

Active Publication Date: 2013-08-07
盐城天合国能光伏科技有限公司
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Problems solved by technology

[0002] At present, during the preparation process of the original selective emission electrode battery, the square resistance of the non-masked area needs to be monitored after cleaning after masking, but the four-probe tester (an instrument for testing square resistance) needs to monitor the square resistance of the non-masked area. Probes are easy to press against the gate line, causing test errors and difficulties in subsequent process adjustment and optimization

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  • Method for testing sheet resistance in preparation process of selective transmission electrode battery

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Embodiment Construction

[0013] In order to make the content of the present invention easier to understand clearly, the present invention will be described in further detail below according to specific embodiments in conjunction with the accompanying drawings,

[0014] A method for testing square resistance during the preparation of selective emission electrode batteries. The steps of the method are as follows: 1) designing grating patterns; 2) selecting substrates 1-3 of the same batch of selective emission electrode batteries , and open a positioning hole 1-1 at the center of the substrate substrate 1-3, the center position of the four probes of the four-probe tester is centered on the axis of the positioning hole 1-1, and the Probe areas corresponding to four probes are respectively formed on the bottom 1-3, and probe positioning holes 1-2 are respectively opened on the four probe areas of the substrate substrate 1-3 to form a monitoring chip substrate; 3 ) Coating photoresist on the monitor sheet ...

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Abstract

The invention discloses a method for testing a sheet resistance in a preparation process of a selective transmission electrode battery. The method comprises the following steps of 1, designing a grid pattern; 2, producing a monitor plate substrate; 3, coating photoresist on the monitor plate substrate, and masking a positioning hole and four probe positioning holes by utilizing the photoresist in identical thickness; 4, producing a monitoring screen printing plate; 5, adopting the monitoring screen printing plate to print a monitor plate according to a battery piece production process; 6, etching and washing a non-mask area of the monitor plate; 7, adopting a four-probe tester, inserting four probes into the corresponding probe positioning holes, and testing the sheet resistance of the non-mask area of the monitor plate; 8, adjusting the washing parameter of the selective transmission electrode battery according to the tested sheet resistance result, and repeating the washing step in step 6 and the step 7 until the sheet resistance value of the monitor plate is standard, thereby determining the washing parameters of the selective transmission electrode battery. Due to the adoption of the method, the test error phenomenon caused by pressing a grid line part in the test process can be avoided, the test process is fast and convenient, the test flow is simplified, and the test time is saved.

Description

technical field [0001] The invention relates to a method for testing square resistance in the preparation process of selective emission electrode batteries. Background technique [0002] At present, during the preparation process of the original selective emission electrode battery, the square resistance of the non-masked area needs to be monitored after cleaning after masking, but the four-probe tester (an instrument for testing square resistance) needs to monitor the square resistance of the non-masked area. The probes are easy to press against the gate line, causing test errors and difficulties in subsequent process adjustment and optimization. Contents of the invention [0003] The technical problem to be solved by the present invention is to overcome the defects of the prior art and provide a method for testing square resistance during the preparation of selective emitter electrode cells, which can avoid the phenomenon of test errors caused by pressing on the grid lin...

Claims

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Application Information

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IPC IPC(8): G01R27/02
Inventor 卫志敏
Owner 盐城天合国能光伏科技有限公司
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