A method and device for testing functional circuits

A technology for testing functions and functional circuits, applied in the field of testing, can solve problems such as inability to accurately control functional circuits in real time, inability to know functional circuit problems, and damage to products, achieving high accuracy, improving efficiency, and reducing costs.

Active Publication Date: 2016-03-30
ALCATEL LUCENT SAS +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this case, when there are voltage fluctuations, it is impossible to accurately and real-time control the specific functional circuits in the circuit board, such as the operation of SDH communication circuit, Ethernet communication circuit, CPU and memory circuit, FPGA and memory circuit, etc. , so that it is impossible to know the problems existing in these functional circuits
If it is necessary to perform undervoltage test, overvoltage test and voltage noise tolerance test on the functional circuit, it is necessary to weld a new connection terminal between the power supply circuit and the functional circuit to access the external test device, which will be quite complicated and destroy original product

Method used

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  • A method and device for testing functional circuits
  • A method and device for testing functional circuits
  • A method and device for testing functional circuits

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Embodiment Construction

[0023] figure 1 A schematic diagram of a circuit board including an apparatus for testing a functional circuit according to an embodiment of the present invention is shown.

[0024] As shown in the figure, the circuit board 100 includes a power supply circuit 101 , a device 102 for testing a functional circuit and a functional circuit 103 .

[0025] The power supply circuit 101 has an output pin O, a feedback pin F and a ground pin G, and supplies power to the functional circuit 103 through the device 102 for testing the functional circuit. The power supply circuit 101 may be, for example, a direct current-direct current (DC-DC) converter, a low dropout linear regulator (LDO) and the like.

[0026] The functional circuit 103 may include any suitable type of functional circuit, such as an SDH communication circuit, an Ethernet communication circuit, a CPU and a memory circuit, and an FPGA and a memory circuit. The functional circuit 103 also has a service interface (not shown...

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PUM

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Abstract

The invention provides a method and a device for testing a functional circuit as well as a circuit plate employing the device. A power supply circuit provides the functional circuit with power, and the power supply circuit is provided with an output pin, a feedback pin and a grounding pin. The device comprises a first regulation circuit and a first control unit, wherein the first regulation circuit is provided with a resistor coupled among the output pin, the grounding pin and the feedback pin in the power supply circuit according to the test type and a first switch connected in series with the resistor, or is provided with at least two resistors connected in parallel with each other and the first switch respectively connected in series with each resistor; and the first control unit is connected with each first switch via a first control bus and controls the switch on / off of each first switch. The device can accurately acquire the power supply performance of the functional circuit and saves an externally connected test device, so as to simplify the test procedures, remarkably lower the cost, improve the efficiency and has higher accuracy.

Description

technical field [0001] The invention relates to a testing method, in particular to a method and device for testing functional circuits, and a circuit board. Background technique [0002] The ever-increasing layout density and complexity of circuit boards increases the complexity of quality and performance testing during product development and inspection. In order to check the quality and performance of the product, many testing methods have been adopted to check the product performance, especially the power supply performance of the product, such as undervoltage test method, overvoltage test method and voltage noise tolerance test method. [0003] In the prior art, in order to realize the undervoltage test method, the overvoltage test method and the voltage noise tolerance test method, etc., an external test device is usually required, and the external test device can adjust the amplitude and frequency of the noise, and can also provide adjustable Voltage, and the test sig...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 邹勇卓曾广鑫张力邹锟
Owner ALCATEL LUCENT SAS
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