LX I embedded type reconfigurable general test platform capable of being used for on-site test

Abstract

The invention discloses an LX I embedded type reconfigurable general test platform capable of being used for an on-site test. The test platform mainly comprises a core control unit, an FPGA integrated test unit, an instrument function unit, a test program set, a Web server and the like. Modularized hardware design is reliably and tightly connected with a function module through a compact and firm portable machine box. The core control unit finishes control and communication of a whole system. The integrated test unit mainly completes logic functions of test instruments. The instrument function unit mainly completes conversion of signals. On the basis of LX I standard design, the test platform has multiple communication modes, is suitable for mobile tests, and facilitates secondary development. Hardware is designed in a modularized mode, and is compact in structure, small in size and low in weight. Software meets standards such as IVI, SCPI, ATML and the like, and is strong in generality. The instruments have the strong data processing ability and have functions of multi-channel parallel testing and online reconfiguration of the hardware and the software. What is needed is a browser during use of the instruments, the instruments can be operated remotely and the online reconfiguration of the instruments is achieved.

Description

technical field [0001] The invention belongs to the field of automatic testing, relates to the field of general testing based on LXI bus, and also relates to the reconfigurable parallel testing technology of software and hardware of embedded processors and programmable logic devices based on DaVinci architecture. Background technique [0002] With the development of technology, the automatic test system has also gone through the stage of special instruments, the stage of building blocks of desktop instruments, the stage of modularization, and now the stage of network. Modern test systems have made great progress in terms of test performance, maintainability, and scalability, and have greatly promoted the development of various technologies. Although test systems based on bus technologies such as PCI, VXI, and PXI are still the mainstream of testing, as people's requirements for testing equipment such as portability, flexibility, versatility, and modularization become more an...

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the on-site portable test requirements of most contemporary complex electronic devices, overcome the common shortcomings of current test systems such as specific functions, large volume, and high cost, and propose a multi-core embedded multimedia processor and large-capacity FPGA. Devices, developed a wireless LXI bus portable universal test platform that can be flexibly configured on site, which can meet the test requirements for on-site maintenance and guarantee of various complex equipment, and is resistant to harsh environments, small in size and light in weight, flexible in test function configuration, and widely applicable features

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