Analog calculation method of ablating silicon nitride by ultrashort pulse laser

An ultra-short pulse laser and analog computing technology, which is applied to instruments, adaptive control, control/regulation systems, etc., can solve the problems of difficult to determine process parameters and difficult to control the removal accuracy of ultra-short pulse laser ablation of silicon nitride, etc. Achieve the effect of improving machining accuracy

Active Publication Date: 2013-08-28
DALIAN UNIV OF TECH
View PDF6 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] In order to solve the problems that the removal accuracy is difficult to control and the process parameters are difficult to determine in the process of ultrashort pulse laser ablation of silicon nitride, the present invention overcomes the shortcomings of the existing simulation calculation method, and studies the single effect of a single variable and multiple The law of joint action of two variables, the key lies in:

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analog calculation method of ablating silicon nitride by ultrashort pulse laser
  • Analog calculation method of ablating silicon nitride by ultrashort pulse laser
  • Analog calculation method of ablating silicon nitride by ultrashort pulse laser

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] Attached below Figure 1-6 The present invention is further described with embodiment: as figure 1 As shown, a flow chart of a simulation calculation method for ultrashort pulse laser ablation of silicon nitride, the embodiment of the present invention requires: under the condition that the laser wavelength is 780nm, the process parameters used to guide the actual processing are obtained through simulation calculation. It mainly includes the damage threshold under the condition of pulse width of 10fs~10ps; the energy density is 1J / cm 2 ~8J / cm 2 , when the pulse width is 12fs, 35fs, 220fs, the ablation depth, volume and scanning speed are 0-3mm / s, and the energy density is 4.0J / cm 2 ~8.0J / cm 2 residual height at . The specific simulation calculation steps are as follows:

[0058] A. Establish the ablation threshold, depth and ablation volume model of ultrashort pulse laser ablation of silicon nitride, and initialize the parameters of the model constants. Through M...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an analog calculation method of ablating silicon nitride by ultrashort pulse laser, and Matlab is utilized to perform analog calculation and analysis on processing parameters. The analog calculation method mainly comprises the following steps that an ablating model of ablating silicon nitride by ultrashort pulse laser is established, and calculating parameters are initialized; boundary conditions of the plasma density are defined, and an ablating threshold, depth and volume with different analog parameters are calculated through the model; and on the basis of calculation results and a residual height model, the laser ablated residual height is analyzed and evaluated, and guiding parameters are given. By using the analog calculation method, the process of obtaining the processing parameters by repeated experiment can be avoided, analog results can be utilized to optimize the processing parameters, thereby shortening the product cycle, reducing the processing cost and increasing the production efficiency, and therefore, the analog calculation method has an important guiding value for the actual manufacturing process of ablating silicon nitride by ultrashort pulse laser.

Description

technical field [0001] The invention belongs to the technical field of ultrashort pulse laser micromachining, in particular to a simulation calculation method for ultrashort pulse laser ablation of silicon nitride. Background technique [0002] With the rapid development of advanced manufacturing technology and industrial level, research on silicon nitride materials has also attracted much attention. Because silicon nitride materials have the characteristics of high chemical stability, high thermal shock resistance, high hardness, high temperature resistance, radiation resistance, corrosion resistance, good thermohardness, and excellent optical properties. Therefore, it has been widely used in optoelectronics, machinery, atomic energy, aerospace and other industries, and as it is widely used in precision and ultra-precision fields such as microelectronics, it is particularly important to perform microprocessing on it. However, silicon nitride is a high-hard and brittle mate...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G05B13/00
Inventor 吴东江姚龙元马广义牛方勇郭东明
Owner DALIAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products