VS transient negative voltage endurance capacity testing device and method for high-voltage integrated circuit

Abstract

The invention provides a VS transient negative voltage endurance capacity testing device for a high-voltage integrated circuit. The VS transient negative voltage endurance capacity testing device comprises a half-bridge drive circuit and a negative voltage generating circuit, wherein the negative voltage generating circuit comprises a control circuit, a first switching device and a negative voltage adjusting power supply; the control circuit can be connected with an HIN signal input end of the high-voltage integrated circuit and used for generating a pulse signal with a preset pulse width and driving the first switching device to be switched on and off; the output end of the first switching device is connected to an output node of the half-bridge drive circuit, and the input end of the first switching device is connected to the negative voltage adjusting power supply; and when the first switching device is electrified, the negative voltage which is equal to the absolute value of the negative voltage adjusting power supply is overlaid onto the output node of the half-bridge drive circuit. The invention also provides a testing method. According to the testing device provided by the invention, the negative voltage generating circuit is additionally arranged on the basis of the half-bridge driving circuit and can generate the VS transient negative voltage of which the amplitude and the duration time can be continuously adjusted, and therefore the VS transient negative voltage endurance capacity of the high-voltage integrated circuit can be tested.

Description

technical field [0001] The invention relates to the field of high-voltage integrated circuits, in particular to a high-voltage integrated circuit VS transient negative pressure tolerance testing device and method. Background technique [0002] HVIC (High Voltage Integrated Circuit) integrates new high-voltage power devices, high-voltage and low-voltage logic control circuits and protection circuits into a single silicon chip. Due to its high reliability, stability, low power consumption, volume, weight and Advantages in cost and other aspects have been widely used in various fields, such as motor drive, fluorescent lamp drive and power management, which play an important role in the intelligentization and energy saving of the application field. [0003] When high-voltage integrated circuits are used in the environment of inductive loads, a typical problem is: hard switching will generate negative transient voltage spikes, and its amplitude and duration will vary with the swi...

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Problems solved by technology

[0009] In view of the aforementioned existing test equipment, the amplitude and duration of the VS transient negative pressure cannot be continuously adjusted, resulting in the inability to judge whether the high-voltage integrated circuit can work normally under various amplitudes and various durations of VS negative pressure. The technical problem of the work, the present invention provides a new type of high voltage integrated circuit VS transient negative pressure tolerance test device

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