VS transient negative voltage endurance capacity testing device and method for high-voltage integrated circuit

A high-voltage integrated circuit and capability testing technology, which is applied in the field of high-voltage integrated circuits, can solve problems such as the inability to judge high-voltage integrated circuits, the inability to continuously adjust the amplitude and duration of VS transient negative pressure, etc.

Active Publication Date: 2013-09-18
上海奔赛电子科技发展有限公司
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] In view of the aforementioned existing test equipment, the amplitude and duration of the VS transient negative pressure cannot be continuously adjusted, resulting in the inability to judge whether the high-voltage integrated circuit can ...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • VS transient negative voltage endurance capacity testing device and method for high-voltage integrated circuit
  • VS transient negative voltage endurance capacity testing device and method for high-voltage integrated circuit
  • VS transient negative voltage endurance capacity testing device and method for high-voltage integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] In order to make the technical problems, technical solutions and beneficial effects solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0028] Please refer to Figure 4 As shown, a high-voltage integrated circuit VS transient negative voltage tolerance testing device includes a half-bridge drive circuit and a negative voltage generating circuit, and the negative voltage generating circuit includes a control circuit 2, a first switching device M3 and a negative voltage regulator Power supply VDC_VS; where,

[0029] The control circuit 2 can be connected to the HIN signal input terminal (high-side input terminal) of the high-voltage integrated circuit 1, and is used to generate a pulse signal with a prede...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a VS transient negative voltage endurance capacity testing device for a high-voltage integrated circuit. The VS transient negative voltage endurance capacity testing device comprises a half-bridge drive circuit and a negative voltage generating circuit, wherein the negative voltage generating circuit comprises a control circuit, a first switching device and a negative voltage adjusting power supply; the control circuit can be connected with an HIN signal input end of the high-voltage integrated circuit and used for generating a pulse signal with a preset pulse width and driving the first switching device to be switched on and off; the output end of the first switching device is connected to an output node of the half-bridge drive circuit, and the input end of the first switching device is connected to the negative voltage adjusting power supply; and when the first switching device is electrified, the negative voltage which is equal to the absolute value of the negative voltage adjusting power supply is overlaid onto the output node of the half-bridge drive circuit. The invention also provides a testing method. According to the testing device provided by the invention, the negative voltage generating circuit is additionally arranged on the basis of the half-bridge driving circuit and can generate the VS transient negative voltage of which the amplitude and the duration time can be continuously adjusted, and therefore the VS transient negative voltage endurance capacity of the high-voltage integrated circuit can be tested.

Description

technical field [0001] The invention relates to the field of high-voltage integrated circuits, in particular to a high-voltage integrated circuit VS transient negative pressure tolerance testing device and method. Background technique [0002] HVIC (High Voltage Integrated Circuit) integrates new high-voltage power devices, high-voltage and low-voltage logic control circuits and protection circuits into a single silicon chip. Due to its high reliability, stability, low power consumption, volume, weight and Advantages in cost and other aspects have been widely used in various fields, such as motor drive, fluorescent lamp drive and power management, which play an important role in the intelligentization and energy saving of the application field. [0003] When high-voltage integrated circuits are used in the environment of inductive loads, a typical problem is: hard switching will generate negative transient voltage spikes, and its amplitude and duration will vary with the swi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/28
Inventor 高存旗刘杰张华群
Owner 上海奔赛电子科技发展有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products