Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Strain sensor simulator

A technology of strain sensor and simulator, applied in the direction of electric/magnetic solid deformation measurement, electromagnetic measurement device, etc., can solve the problems of system error, setting value is not linear relationship, etc., to overcome error, facilitate subsequent processing, output impedance Reduced effect

Active Publication Date: 2013-09-25
BEIJING WUZI UNIVERSITY
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, although the existing sensor simulator circuit eliminates the influence of the common-mode voltage on the zero point, the output signal of the DAC circuit affects the value of the common-mode voltage after passing through the operational amplifier, resistor R5, and resistor R3, so that only at the zero point When the common mode voltage is the partial pressure of R1 and R2 on the input positive and negative voltages, the effective output of the signal is not linear with the set value of the DAC, so that there is a systematic error between the set value and the actual output value

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Strain sensor simulator
  • Strain sensor simulator
  • Strain sensor simulator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] figure 2 It is a schematic structural diagram of a sensor simulator in the prior art of the present invention; image 3 Generate a circuit diagram for the analog signal of the strain gauge sensor simulator of the embodiment of the present invention; Figure 4 for figure 2 Schematic diagram of the structure of the reference voltage generating circuit of the illustrated embodiment.

[0024] Such as figure 1 As shown, the sensor simulator of this emb...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a strain sensor simulator which comprises a sensor interface, a precision resistance network, a common mode voltage switching circuit, an output signal generating circuit, a DA switching circuit, a reference voltage generating circuit, a control system and a temperature sensor. The sensor interface, the precision resistance network, the common mode voltage switching circuit and the output signal generating circuit are connected in sequence. The reference voltage generating circuit is connected to the sensor interface, the common mode voltage switching circuit and the DA switching circuit. The control system is connected to the temperature sensor and the DA switching circuit. The DA switching circuit is connected with the output signal generating circuit. The sensor interface is connected with an external measuring instrument. The reference voltage generating circuit generates a positive and negative reference source voltage of the DA switching circuit according to the voltage output by the common mode voltage switching circuit and the positive voltage output by the sensor interface. The DA switching circuit generates a DA output voltage according to the positive and negative reference source voltage and a set digital quantity, and then generates an output analog signal together with the voltage output by the common mode voltage switching circuit. The output analog signal is output to the external measuring instrument through the sensor interface.

Description

technical field [0001] The invention relates to a strain sensor simulator, in particular to a high-precision resistance strain sensor simulator. Background technique [0002] When producing, overhauling, and inspecting various measuring instruments that use the output of strain gauge sensors as input signals, it is usually necessary to use a high-precision regulated power supply as a standard signal to measure various errors of the instruments. On the one hand, the price of the high-accuracy regulated power supply is relatively expensive; on the other hand, the high-accuracy regulated power supply must be used in conjunction with a high-accuracy voltmeter, which is not convenient for on-site use. Therefore, in the process of production practice, it is often necessary to use sensor simulators to test and test measuring instruments. [0003] An existing sensor simulator such as figure 1 As shown, the voltage at the dividing point of the precision resistor network is used as ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/16
Inventor 郭键朱杰周丽董萍萍郭奕崇
Owner BEIJING WUZI UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products