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Silicon-penetrating through hole with control electrode and manufacturing method thereof

A technology of through-silicon vias and control circuits, which is applied to circuits, electrical components, and electrical solid-state devices, and can solve problems such as increasing the complexity of chip manufacturing processes

Active Publication Date: 2013-10-23
NAN YA TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although such a design is helpful to the design of the circuit, it also increases the complexity of each chip manufacturing process.

Method used

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  • Silicon-penetrating through hole with control electrode and manufacturing method thereof
  • Silicon-penetrating through hole with control electrode and manufacturing method thereof
  • Silicon-penetrating through hole with control electrode and manufacturing method thereof

Examples

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Embodiment Construction

[0029] In order to enable those skilled in the art of the present invention to further understand the present invention, the following description lists several preferred embodiments of the present invention, together with the accompanying drawings and descriptions, to describe in detail the content of the present invention and the desired effect .

[0030] Please refer to Figure 3 to Figure 9 , which is a schematic diagram showing the steps of the manufacturing method of the TSV with the control circuit in the present invention. Such as image 3 As shown, a substrate 300 is firstly provided, such as a silicon substrate, an epitaxial silicon substrate, a silicon germanium substrate, a silicon carbide substrate or a silicon-covered insulating ( silicon-on-insulator, SOI). The substrate 300 has a first surface 302 and a second surface 304 . The first surface 302 is, for example, the active surface of the substrate 300 , and the second surface 304 is, for example, the back s...

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PUM

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Abstract

The invention discloses a silicon-penetrating through hole with a control circuit. The through hole includes a substrate, a conductive electrode, a vertical transistor and a conducting layer, wherein the conductive electrode penetrates through the substrate; the vertical transistor includes a source electrode, a channel and a drain electrode, which are arranged on the conductive electrode and the channel is arranged between the source electrode and the drain electrode; a gate is arranged in the substrate; a gate dielectric layer is arranged between the channel and the gate; and the conducting layer is arranged on the drain electrode of the vertical transistor.

Description

technical field [0001] The present invention relates to a through-silicon via and a manufacturing method thereof, in particular to a through-silicon via with a control electrode and a manufacturing method thereof. Background technique [0002] In the modern information society, micro-processing systems composed of integrated circuits (ICs) have long been widely used in all aspects of life, such as automatic control of home appliances, mobile communication equipment, personal computers, etc., are integrated use of the circuit. With the advancement of technology and the various imaginations of electronic products in human society, integrated circuits are also developing in a more diverse, more sophisticated, and smaller direction. [0003] Generally, integrated circuits are formed through dies produced in existing semiconductor processes. The process of manufacturing crystal grains begins with the production of a wafer: first, multiple regions are distinguished on a wafer, a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/522H01L21/768
Inventor 陈逸男徐文吉叶绍文刘献文
Owner NAN YA TECH
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