Semiconductor component sorting system

Abstract

A semiconductor component sorting system comprises N (an integer greater than 0) sorting devices for executing a loading step of loading a semiconductor component to be tested on to a test pallet and an unloading step of separating the tested semiconductor component from the test pallet; a sorting conveying unit for carrying the test pallet along the direction where the sorting devices are arranged; M (an integer greater than M) test devices separated from the sorting devices; a test carrying unit for carrying the test pallet along the direction where the test devices are arranged; and a connection carrying unit which is connected respectively with the sorting conveying unit and the test carrying unit to carry the test pallet between the sorting devices and the test devices. Compared with devices conducting the loading and unloading steps, the semiconductor component sorting system comprises more devices for carrying out test steps. Even difference exist among the time for carrying out the loading step, the unloading step and the test step, the work time delay can be prevented, so as to improve the semiconductor component production efficiency.

Description

technical field [0001] The present invention relates to a semiconductor component sorting system that connects semiconductor components to be tested to testing equipment and classifies the tested semiconductor components into grades. Background technique [0002] Memory or non-memory semiconductor elements, module ICs, etc. (hereinafter referred to as "semiconductor elements") are manufactured through devices that perform various processes. A test sorting device, one of these devices, is a device for performing a process of testing a semiconductor component by connecting the semiconductor component to a test device and sorting the tested semiconductor component into grades according to a test result. The semiconductor components are tested and classified as acceptable products, thus completing the manufacture. [0003] For example figure 1 is a brief top view of a test sorting device according to the prior art. [0004] refer to figure 1 , the test sorting device 100 acc...

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Problems solved by technology

However, as mentioned above, until the test process is completed, the test tray T needs to be on standby in the loading unit 110, and the test sorting device 100 of the prior art cannot immediately transport the test tray T that has completed the unloading process to the above-mentioned loading unit 110. Make the test tray T stand by in the above-mentioned unloading unit 130

In this way, in the test sorting apparatus 100 of the prior art, there is a problem that the time it takes for the above-mentioned unloading unit 130 to perform the unloading process on the next test tray T is prolonged.

[0011] Third, according to the test and sorting device 100 of the prior art, as long as one of the above-mentioned loading unit 110, the above-mentioned testing unit 120 and the above-mentioned unloading unit 130 breaks down, the remaining structures that work normally cannot perform work.

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