Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Etch first and then seal three-dimensional system-on-chip front-mount bump packaging structure and process method

A system-level chip, etch first and then seal technology, which is applied in the manufacture of electrical components, electrical solid devices, semiconductor/solid devices, etc., can solve the problems of not being able to embed chips, limiting the integration of packaging functions, etc.

Active Publication Date: 2015-11-18
江阴芯智联电子科技有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The purpose of the present invention is to overcome the above-mentioned shortcomings, and provide a three-dimensional system-level chip flip-chip bump packaging structure and process method after sealing first and etching later, which can solve the problem that traditional metal lead frames or multilayer circuit substrates cannot embed chips and passive components. However, the problem of limiting the integration of the entire package function and the traditional organic substrate require thinner line width and narrower line-to-line spacing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Etch first and then seal three-dimensional system-on-chip front-mount bump packaging structure and process method
  • Etch first and then seal three-dimensional system-on-chip front-mount bump packaging structure and process method
  • Etch first and then seal three-dimensional system-on-chip front-mount bump packaging structure and process method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0207] Embodiment 1, single-layer line single-chip front-mounted single-turn pins

[0208] see Figure 31 , is a structural schematic diagram of Embodiment 1 of the three-dimensional system-on-a-chip front-mounted bump package structure of the present invention, which includes a base island 1 and pins 2, and the front and back sides of the base island 1 are bonded by conductive or non-conductive The substance 3 is respectively provided with a first chip 4 and a second chip 5, the fronts of the first chip 4 and the second chip 5 are respectively connected with the front and the back of the pin 2 with a metal wire 6, and the lead The front of pin 2 is provided with conductive pillars 7, the area around the base island 1, the area between base island 1 and pin 2, the area between pin 2 and pin 2, the upper part of base island 1 and pin 2 The area of ​​the base island 1 and the lower part of the pin 2, as well as the first chip 4, the second chip 5, the metal wire 6 and the condu...

Embodiment 2

[0270] Embodiment 2, multi-turn single-chip formal installation + passive components + electrostatic discharge ring

[0271] see Figure 32 , is a structural schematic diagram of Embodiment 2 of the three-dimensional system-on-chip front-mounted bump package structure of the present invention. The difference between Embodiment 2 and Embodiment 1 is that the conductive pillar 7 has multiple turns, and the pin 2 and the pin 2 are connected to the passive device 10 through a conductive adhesive substance, and an electrostatic discharge ring 14 is arranged between the base island 1 and the pin 2, and the back surface of the electrostatic discharge ring 14 is connected to the second chip 5 The fronts are connected by metal wires 6, and the passive device 10 can be connected between the back of the pin 2 and the front of the pin 2, or between the back of the pin 2 and the back of the electrostatic discharge ring 14, or Bridged between the back of the base island 1 and the back of t...

Embodiment 3

[0272] Embodiment 3, single-circle multi-base island tiling multi-chip formal installation

[0273] see Figure 33 , is a structural schematic diagram of Embodiment 3 of the three-dimensional system-on-a-chip front-mount bump package structure of the present invention, the difference between Embodiment 3 and Embodiment 1 is that there are multiple base islands 1, and The back of the island 1 is provided with a second chip 5 through a conductive or non-conductive adhesive substance 3 , and the front of the second chip 5 is connected with the front of the second chip 5 through a metal wire 6 .

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a convex point packaging structure and a technique of a horizontal chip of a firstly-etched and then-packaged three-dimensional system level. The structure comprises pads and pins, wherein first chips and second chips are arranged on front sides and rear sides of the pads; front sides of the first chips and the second chips are connected with the front sides and the rear sides of the pins through metal wires respectively; conductive columns are arranged on the front sides of the pins; the peripheral areas of the pads, the areas between the pads and the pins and among the pins, the areas of the upper parts and the lower parts of the pads and the pins and outsides of the first chips, the second chips, the metal wires and the conductive columns are packaged with a molding compound; surfaces, exposing out the molding compound, of the conductive columns are plated with an anti-oxidation layer; and metal balls are arranged at the tops of the conductive columns. According to the convex point packaging structure and the technique of the horizontal chip of the firstly-etched and then-packaged three-dimensional system level, the problem that the integration of a whole packaging function is limited due to the fact that an object cannot be embedded into a conventional metal lead frame or an organic multilayer circuit substrate is solved.

Description

technical field [0001] The invention relates to an etching-before-sealing three-dimensional system-level chip front-mount bump packaging structure and a process method. It belongs to the technical field of semiconductor packaging. Background technique [0002] Traditional four-sided leadless metal lead frame package structure such as Figure 85 As shown, the main manufacturing process is to take metal sheets for chemical etching and metal plating to make a base island for carrying chips and a metal lead frame with inner and outer pins, and then perform one-sided chip loading and wire bonding on this basis. , encapsulation and other packaging processes. [0003] The traditional organic multilayer circuit substrate packaging structure such as Figure 86 As shown, the main process is to form a multi-layer circuit board by stacking the core material of the glass fiber board by accumulating materials, opening holes between the circuit layers by laser drilling, and then plating ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/60H01L21/56
CPCH01L2224/48091H01L2224/73204H01L2224/73265
Inventor 梁志忠梁新夫王亚琴王孙艳章春燕
Owner 江阴芯智联电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products