Development method and system of chip testing software

Abstract

The invention discloses a method and system for developing IC (Integrated Circuit) testing software, which are applied to the development and debugging of the testing software in chip testing. The system at least comprises a mainframe, a plurality of computers or network terminals for running the program of the mainframe, an ATE (Automatic Test Equipment) emulator, a plurality of computers or network terminals for running the program of the ATE emulator, and a data source used for any carriers of effective data of the program of the mainframe, wherein the effective data is used for recording the data for which the ATE emulator can not perform direct access. According to the invention, an ATE data processing module, a network communication module and the program of the mainframe are developed without the existence of the ATE, so that the ATE which does not participate in the development of the chip testing software can be used for formal testing, thus the development cost of the chip testing software is greatly lowered; meanwhile, the participation of a chip is not required, so that the development of the chip testing software can be started earlier, therefore, the time delay of the chip testing, caused by the development of the chip testing software, is avoided, namely that the time-to-market of the chip is shortened; and in addition, the software developing and debugging time for a developer is enough, so that the software success rate can be sufficiently ensured.

Description

Technical field [0001] The invention relates to the field of chip testing, and mainly relates to an ATE simulator in chip testing and a method for developing ATE peripheral software in chip testing. Background technique [0002] In recent years, as the scale of chip / IC design complexity continues to expand, chip testing has become more and more complex, which makes IC testing more and more expensive. At the same time, in order to meet the various needs of customers, especially the needs of information security and complex calculations, when the chip is tested for ATE (Automatic Test Equipment, integrated circuit (IC) automatic test machine) testing, it is necessary to use the host specified by the customer for data processing. Do not want ATE to complete these data processing (such as information security requirements, or data processing speed requirements), which requires the development of host programs on the host. If you need ATE to participate in the development of these ho...

AI Technical Summary

Problems solved by technology

[0008] 1. Provide a method and data generator for generating IC test data to solve the problem that various correct and wrong IC test data streams cannot be generated without ATE

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