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Measuring method for radiation characteristics of semitransparent medium based on multi-frequency modulation laser irradiation

A semi-transparent medium, modulated laser technology, applied in scattering characteristic measurement, color/spectral characteristic measurement, transmittance measurement, etc., can solve the problem of measurement result error and so on

Active Publication Date: 2013-12-18
严格集团股份有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem of large errors in the measurement results of single measurement information in the measurement of the radiation characteristics of semi-transparent media, and to provide a method for measuring the radiation characteristics of semi-transparent media based on multi-frequency modulation laser irradiation

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  • Measuring method for radiation characteristics of semitransparent medium based on multi-frequency modulation laser irradiation
  • Measuring method for radiation characteristics of semitransparent medium based on multi-frequency modulation laser irradiation
  • Measuring method for radiation characteristics of semitransparent medium based on multi-frequency modulation laser irradiation

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specific Embodiment approach 1

[0029] Specific implementation mode one: the following combination figure 1 Describe this embodiment, the method for measuring radiation characteristics of semi-transparent media based on multi-frequency modulation laser irradiation described in this embodiment, it includes the following steps:

[0030] Step 1: Set the number of sampling times to N, where N is a natural number greater than or equal to 2;

[0031] Step 2: Take the thickness as L i The semi-transparent medium specimen to be tested, one side of the semi-transparent medium specimen to be tested is uniformly coated with blackness ε i opaque coating with angular frequency ω i The laser beam irradiates the non-coated side of the semi-transparent medium specimen, and the laser beam is θ with the normal direction of the semi-transparent medium specimen i Angle, use the detector to measure and obtain the frequency-domain complex hemispherical reflection signals on the surface boundary of N groups of translucent mediu...

specific Embodiment approach 2

[0041] Embodiment 2: This embodiment further describes Embodiment 1. The laser beam described in this embodiment is generated by a sinusoidal light source with adjustable amplitude.

specific Embodiment approach 3

[0042] Embodiment 3: This embodiment further describes Embodiment 1 or 2. The inverse problem algorithm described in this embodiment is an ant colony algorithm.

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Abstract

The invention provides a measuring method for radiation characteristics of a semitransparent medium based on multi-frequency modulation laser irradiation, belongs to the technical field of semitransparent medium radiation characteristic measurement, and solves the problem in the semitransparent medium radiation characteristic measurement that a measurement result error of measurement information of one time is greater. Based on a multi-frequency modulation laser irradiation technology, the measuring method utilizes multi-frequency modulation laser to irradiate the surface of the semitransparent medium with a coating with certain blackness; frequency domain semi-sphere reflection signals of a plurality of groups of boundaries are obtained by changing a laser modulation frequency, a laser incident angle, the thickness of a test piece and the blackness of the coating of the test piece; irradiation physical property parameters of the semitransparent medium are obtained based on the reflection signals by combining an inverse problem solving technology. The measuring method for the radiation characteristics of the semitransparent medium based on the multi-frequency modulation laser irradiation is used for measuring the radiation characteristics of the semitransparent medium.

Description

technical field [0001] The invention relates to a method for measuring the radiation characteristic of a semi-transparent medium based on multi-frequency modulation laser irradiation, and belongs to the technical field of the measurement of the radiation characteristic of a semi-transparent medium. Background technique [0002] Translucent media are widely used in scientific fields such as industrial production, biomedicine, and information communication. Studying the physical parameters of translucent media has important practical significance in many fields, such as non-destructive testing, laser processing and manufacturing (such as laser cutting glass, liquid crystal panels, etc.). In recent years, with the rapid development of modern high-tech such as aerospace, infrared detection, infrared characteristics of targets and environments, lasers, electronic devices, and biomedicine, it is particularly important to understand the thermal and physical parameters of translucen...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/39G01N21/49G01N21/59
Inventor 齐宏任亚涛张彪孙双成阮立明
Owner 严格集团股份有限公司
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