Test machine for finished chips

A testing machine and chip technology, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of large manual intervention, low efficiency, large chip pollution, etc., and achieve the effect of reducing unfavorable factors and high detection efficiency

Active Publication Date: 2013-12-18
JIAXING JINGYAN INTELLIGENT EQUIP TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing operation process, this series of actions are all done manually, and individual steps are realized through automatic operation, but generally speaking, manual intervention is large, efficiency is low, and pollution to the chip is large

Method used

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  • Test machine for finished chips
  • Test machine for finished chips

Examples

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Embodiment Construction

[0026] The specific implementation of the finished chip testing machine of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0027] In order to make the present invention easy to understand, some directional terms are used in this specification. It should be noted that the directional terms mentioned in this specification, such as "up", "down", "left", "right", "front", "rear", etc., refer to the direction of the drawings, and The XYZ coordinate system in the drawings is for reference, the positive direction of the Z axis is set to "up", the negative direction of the Z axis is set to "down", the positive direction of the X axis is set to "front", and the negative direction of the X axis is set to "back". The positive direction of the Y axis is set to "Left", and the negative direction of the Y axis is set to "Right". The directional terms used are used to illustrate and understand the present invention, but not to limit t...

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PUM

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Abstract

The invention relates to the technical field of processing of integrated circuit chips, and discloses a test machine for finished chips. A chip conveying device is arranged on the first side of a base, an inspection device is arranged on the second side of the base, the chip conveying device and the inspection device are both provided with longitudinal guide rails along the side edges of the base, a transverse guide rail is arranged on the base and located above the two longitudinal guide rails in an erecting mode, an angle pickup device is arranged on the transverse guide rail, a pickup arm of the angle pickup device is located on the left side of the transverse guide rail, a first camera detection device is arranged on the base and located on the left side of the transverse guide rail, a displacement pickup device is arranged on the transverse guide rail, a pickup arm of the displacement pickup device is located on the right side of the transverse guide rail, and a second camera detection device, an uncovering and covering device, an air cylinder turnover device and a final angle locating device are arranged on the base and located on the right side of the transverse guide rail. The test machine for the finished chips achieves automation of step-by-step detection for the chips, is high in detection efficiency and reduces adverse factors caused by manual intervention.

Description

technical field [0001] The invention relates to the technical field of integrated circuit chip processing, in particular to a chip product testing machine. Background technique [0002] After the finished products of MEMS chips are produced, the chips need to be inspected. The inspection contents include physical defect inspection, magnetic induction inspection, etc. After the inspection, the qualified chips need to be packaged, and the unqualified chips need to be recycled. In the existing operation process, this series of actions are all completed manually, and individual steps are realized through automatic operation, but generally speaking, manual intervention is large, efficiency is low, and pollution to the chip is large. Contents of the invention [0003] The object of the present invention is to solve the above-mentioned technical problems, and to provide a finished chip testing machine, which realizes rapid testing of chips through a fully automated process. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/01
Inventor 朱玉萍朱国璋岑刚
Owner JIAXING JINGYAN INTELLIGENT EQUIP TECH
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