Method for automatically predicting reliability of typical discrete devices based on Saber

Abstract

The invention provides a method for automatically predicting reliability of typical discrete devices based on Saber. The method includes the following steps that (1) characteristic parameters, which affect the working failure rate, of a function model itself are expanded in the function model; (2) electric stress parameters of the devices are acquired through simulation; (3) an environmental factor is added in the function model, and corresponding environment variables are defined in the original function model by the combination of instruction manuals of the discrete devices of different categories; (4) on the basis, a working failure rate model is embedded in the Saber function model; (5) symbols of the devices of different categories are built to recognize the embedded model for automatically predicting reliability; (6) the model for automatically predicting reliability is utilized to conduct Saber circuit function modeling and simulation; (7) correctness inspection is conducted. The method has the advantages that Saber software is utilized, a universal method for expanding device models is provided, parameter values are transmitted into elements, then, a stress analysis model is utilized to automatically calculate the working failure efficiency, and therefore electrical parameter analysis and reliability prediction of the elements can be synchronously carried out.

Description

Technical field: [0001] The invention relates to a reliability automatic prediction method of a typical discrete device based on Saber in the process of reliability design and analysis of electronic products (Saber is a hybrid system simulation software of Synopsys Company of the United States). This method takes advantage of the developability of typical discrete device models in Saber software, and automates the process of manually calculating reliability, that is, uses the secondary development technology of components to embed the manual-based work failure rate model into In the functional model of the device, the designers of related projects can automatically obtain the reliability parameters of these discrete devices while performing functional simulation on the circuit. The invention belongs to the field of reliability design and analysis of electronic products. Background technique [0002] Reliability prediction is an important reliability analysis work in the dev...

AI Technical Summary

Problems solved by technology

Since the working conditions and circuit structure often change during the product design process, the electrical parameter values ​​of components will also change constantly, so the process of predicting component reliability using manual methods will become cumbersome and unintuitive, which is not conducive to design Personnel can accurately and quickly understand the reliability status of the entire circuit

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