Method for automatically predicting reliability of typical discrete devices based on Saber

A discrete device, reliability technology, applied in the direction of instruments, calculations, special data processing applications, etc., can solve unfavorable circuit reliability conditions, cumbersome, unintuitive problems, etc., to achieve the effect of analysis and reliability prediction

Active Publication Date: 2014-01-01
北京可维创业科技有限公司
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Problems solved by technology

Since the working conditions and circuit structure often change during the product design process, the electrical parameter values ​​of components will also change constantly, so the process of predicting co

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  • Method for automatically predicting reliability of typical discrete devices based on Saber
  • Method for automatically predicting reliability of typical discrete devices based on Saber
  • Method for automatically predicting reliability of typical discrete devices based on Saber

Examples

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Embodiment example 1

[0063] An amplifying circuit is used to illustrate the automatic prediction method of the reliability of a typical discrete device. The schematic diagram of the amplifying circuit is shown in figure 2 shown. The steps of the case implementation process are the above seven steps. In this case, it is assumed that the receiver’s working environment category is severe ground movement (G_M2), the ambient temperature is 50°C, and the quality levels of the devices all meet the technical conditions of QZJ840624 “Seven Specialties”. By consulting the GJB Z299C-2006 Electronic Equipment Reliability Prediction Manual, determine the working failure rate models of synthetic resistors, paper and film capacitors, and ordinary bipolar transistors. Through steps 1 to 5, the reliability automatic prediction model of typical discrete devices such as capacitors, resistors, and ordinary bipolar transistors is obtained, as shown in image 3 , Figure 4 , Figure 5 shown. In step six, first as...

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Abstract

The invention provides a method for automatically predicting reliability of typical discrete devices based on Saber. The method includes the following steps that (1) characteristic parameters, which affect the working failure rate, of a function model itself are expanded in the function model; (2) electric stress parameters of the devices are acquired through simulation; (3) an environmental factor is added in the function model, and corresponding environment variables are defined in the original function model by the combination of instruction manuals of the discrete devices of different categories; (4) on the basis, a working failure rate model is embedded in the Saber function model; (5) symbols of the devices of different categories are built to recognize the embedded model for automatically predicting reliability; (6) the model for automatically predicting reliability is utilized to conduct Saber circuit function modeling and simulation; (7) correctness inspection is conducted. The method has the advantages that Saber software is utilized, a universal method for expanding device models is provided, parameter values are transmitted into elements, then, a stress analysis model is utilized to automatically calculate the working failure efficiency, and therefore electrical parameter analysis and reliability prediction of the elements can be synchronously carried out.

Description

Technical field: [0001] The invention relates to a reliability automatic prediction method of a typical discrete device based on Saber in the process of reliability design and analysis of electronic products (Saber is a hybrid system simulation software of Synopsys Company of the United States). This method takes advantage of the developability of typical discrete device models in Saber software, and automates the process of manually calculating reliability, that is, uses the secondary development technology of components to embed the manual-based work failure rate model into In the functional model of the device, the designers of related projects can automatically obtain the reliability parameters of these discrete devices while performing functional simulation on the circuit. The invention belongs to the field of reliability design and analysis of electronic products. Background technique [0002] Reliability prediction is an important reliability analysis work in the dev...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 任羿李静
Owner 北京可维创业科技有限公司
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