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High-speed paper defect detecting system based on Camera Link interface

A paper defect detection and interface technology, applied in the direction of optical testing flaws/defects, etc., can solve the problems of slow data transmission, complex paper defect detection algorithm, and large amount of data transmitted.

Inactive Publication Date: 2014-01-08
QILU UNIV OF TECH
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Problems solved by technology

However, with the improvement of modern papermaking technology and the increasing requirements of modern life and production on paper quality, the types of paper surface defects that need to be detected are becoming more and more complex, which means that the paper defect detection algorithm is becoming more and more complex. Complicated, that is, the amount of transmitted data is getting larger and larger, which also leads to slower and slower data transmission of the existing paper defect detection system

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  • High-speed paper defect detecting system based on Camera Link interface
  • High-speed paper defect detecting system based on Camera Link interface
  • High-speed paper defect detecting system based on Camera Link interface

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Embodiment Construction

[0022] Accompanying drawing is the specific embodiment of the present invention. This high-speed paper defect detection system based on Camera Link interface includes:

[0023] Image acquisition module: composed of CCD line array cameras, responsible for collecting images from the paper machine;

[0024] Image processing module: completed by FPGA+DSP, responsible for detecting paper defects through image segmentation and other processing;

[0025] Display module; used to view the paper image in real time and set parameters, responsible for displaying the paper image on the host computer;

[0026] The image acquisition module and the image processing module use the Camera Link interface for communication.

[0027] The basic structure of the present invention is as figure 1 As shown, the CCD line array camera installed above the paper machine quickly captures the paper, and the image data is quickly sent to the FPGA through the Camera Link interface for preprocessing, and the...

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Abstract

The invention relates to a paper defect detecting system, in particular to a high-speed paper defect detecting system based on a Camera Link interface. The paper defect detecting system comprises an image acquisition module, an image processing module and a display module. The image acquisition module is used for acquiring image number. The image processing module is used for detecting paper defects by means of image segmenting and the like through a FPGA (field programmable gate array) and a DSP (digital signal processor). The display module is used for checking paper images in real time, setting parameters, and displaying paper images on an upper computer. The image acquisition module is communicated with the image processing module through the Camera Link interface. The acquisition module is composed of CCD (charge coupled device) linear arrays. The paper defect detecting system is fast in data transmission.

Description

(1) Technical field [0001] The invention relates to a paper defect detection system, in particular to a high-speed paper defect detection system based on a Camera Link interface. (2) Background technology [0002] Paper surface defects are an important factor affecting paper quality, and surface paper defect detection plays a very important role in improving paper quality. With the improvement of modern papermaking technology, the speed of the paper machine is also increasing, and the paper is facing the risk of more defects. It is no longer realistic to detect the appearance of paper defects with the naked eye, so the paper defect detection system has emerged. [0003] WIS (Web Inspection System) is one of the widely accepted papermaking process inspection systems, which can provide comprehensive monitoring and measurement for the paper and cardboard production process. ABB's ULMA product is the earliest online paper web detection system. In the early 1970s, it used ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/89
Inventor 周涵李庆华刘晓汪宁
Owner QILU UNIV OF TECH
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