Test data compression method, data uncompress device and data uncompress method
A technology of test data and compression method, applied in the directions of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of occupying test time, increasing test power consumption, etc., reducing storage space, reducing the amount of test data, and reducing the number of bits Effect
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[0109] Example 2: If a compression vector in the cluster compression is 11001, after cluster decompression, the vectors are obtained: 11000, 11011, 11101, 10001, 01001. After the n-bit vector is clustered and decompressed, n new decompressed data are obtained. Each decompressed data differs by one bit from the original compressed data.
[0110] Those skilled in the art can use other circuits to generate decompressed data with one bit flipped each time compared with the original compressed data according to the technical solutions disclosed in the embodiments of the present invention. The embodiment of the present invention discloses a relatively simple hardware circuit to generate new test data flipped by bits. Those skilled in the art can also use a relatively simple hardware circuit to generate other forms associated with the original test data with different characteristics. new test data.
[0111] Figure 8 A schematic diagram of the specific structure of the test mode ...
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