Vision testing device using multigrid pattern
A visual inspection and lattice technology, which is applied in the direction of using optical devices, measuring devices, and optical testing for flaws/defects, can solve problems that easily lead to errors, cannot be distinguished, and inspections take a lot of time to achieve the effect of improving uniformity
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[0038] Hereinafter, the configuration of the present invention will be described in detail with reference to the accompanying drawings.
[0039] Before the description, it needs to be explained that the terms used in this description and the claims are not limited to the meanings explained in the dictionary, and the inventor can properly define the concept of the terms in order to better explain his invention, so , the meanings or concepts of relevant terms shall be interpreted in accordance with the principle of conforming to the technical idea of the present invention.
[0040] Therefore, the embodiments described in this specification and the structures shown in the drawings are only preferred embodiments of the present invention, and cannot fully reflect the technical idea of the present invention. Therefore, various changes or modifications can be made to the present application.
[0041] figure 2 is a schematic side view of a visual inspection device according to ...
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