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Test system of MIPI DSI controller

A test system and controller technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problems of high cost and complicated function test of MIPIDSI controller, and achieve the effect of high accuracy, saving resources and saving expensive expenses.

Active Publication Date: 2014-02-19
FUZHOU ROCKCHIP SEMICON
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Solve the problem of complex function test and high cost of the existing MIPI DSI controller

Method used

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  • Test system of MIPI DSI controller

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Embodiment Construction

[0026] see figure 1 As shown, the present invention will be described in detail below.

[0027] Such as figure 1 As shown, a test system 1 of a MIPI DSI controller, the test system 1 is used to test the MIPI DSI controller 2 . Test system 1 comprises decoder 10 and comparator 11, and decoder 10 is connected with comparator 11, and decoder 10 is used for connecting with MIPI DSI controller 2, and decoder 10 is used for MIPI DSI that MIPI DSI controller 2 sends. The signal is converted into a non-MIPI DSI signal and the non-MIPI DSI signal is sent to the comparator 11; the comparator 11 is used to connect with the MIPI DSI controller 2, and the comparator 11 is used to send the video signal to the MIPI DSI controller 2 and compare the video signal Whether it is consistent with the content of the non-MIPI DSI signal and output the comparison result. When the comparator 11 compares, a method of comparing each data one by one can be adopted.

[0028] In the test system of the p...

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Abstract

The invention provides a test system of an MIPI DSI controller. The test system of the MIPI DSI controller comprises a decoder and a comparator, wherein the decoder and the comparator are connected, the decoder is used for being connected with the MIPI DSI controller, the decoder is used for converting an MIPI DSI signal sent by the MIPI DSI controller into a non-MIPI DSI signal, and sending the non-MIPI DSI signal to the comparator, the comparator is used for being connected with the MIPI DSI controller, and the comparator is used for sending a video signal to the MIPI DSI controller, carrying out comparison to judge whether the video signal is consistent with the non-MIPI DSI signal in content or not, and outputting a comparison result. According to the test system of the MIPI DSI controller, the functional test of the MIPI DSI controller is achieved, the cost is low, implementation is convenient, the test process is simple, and the problem that an existing functional test of the MIPI DSI controller is complex and high in cost is solved.

Description

technical field [0001] The invention relates to the field of IC function test, in particular to a function test system of MIPI DIS controller. Background technique [0002] MIPI (Mobile Industry Processor Interface) protocol is the latest display standard for mobile handheld devices. By configuring a scalable data channel, the interface can achieve a data transmission rate of 3Gb / s. It uses a low-voltage swing differential signal and has a very low output signal level. ECC and CRC checksums are also embedded in the datagram to allow the receiving end to perform error checking and recovery. It was originally designed to reduce the number of connections between the LCD screen and the main control chip, and later developed into a high-speed, high-resolution display screen. Now it is basically a MIPI DSI interface. The advantage is: lower power consumption , higher data transfer rate and smaller PCB footprint, and is optimized for mobile devices, so it is more suitable for the...

Claims

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Application Information

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IPC IPC(8): H04M1/725H04M1/24G01R31/00
Inventor 刘梅英黄美莲林福珍
Owner FUZHOU ROCKCHIP SEMICON
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