Capacitor temperature characteristic automatic test system and test method

Abstract

The invention discloses a capacitor temperature characteristic automatic testing system and testing method. The system includes a host computer, a single chip microcomputer, a capacitance switching module, a high and low temperature box, a temperature sensor, an Agilent capacitor bridge and a capacitor bank under test. The host computer is based on The temperature signal controls the single-chip microcomputer; the relay group of the single-chip microcomputer controls the capacitance switching module as a selection switch of the capacitance path, realizes the corresponding on-off connection of the measured capacitor bank of the Agilent capacitance bridge, and automatically switches the Agilent capacitance bridge and the measured capacitor group. The connection of the measured capacitance realizes the capacitance performance parameter test of each measured capacitor bank under the current temperature respectively; the Agilent capacitor bridge continuously uploads the test results to the host computer through the single-chip microcomputer; the host computer realizes the automatic collection of measurement data. The invention cooperates with the high and low temperature box to realize the automatic gating connection between the capacitor bridge and multiple capacitors, realize the automatic measurement of the temperature characteristics of multiple capacitors, and save manpower.

Description

technical field [0001] The invention relates to a capacitance automatic test system, in particular to an automatic test system aimed at the temperature characteristics of a capacitor. Background technique [0002] Previously, testing the temperature characteristics of capacitors was a very time-consuming process. Taking the measurement of the performance parameters of 20 capacitors in the temperature range of -55 to +155°C as an example, the basic process is as follows: firstly, set the temperature of the high and low temperature box to -55°C, and after the temperature in the high and low temperature box is stabilized, sequentially Adjust the band switch, measure the performance parameters of these 20 capacitors, and then manually record the test results. After the measurement at this temperature point is completed, change the temperature of the high and low temperature box according to the need, for example, adjust the temperature to -45°C. After the temperature is stable ...

AI Technical Summary

Problems solved by technology

In this process, all the measurement work and parameter setting need to be realized by manual operation, the measurement efficiency is low and the workload is heavy

Moreover, since the selected test temperature in the test process is only some discrete points, the small changes in the performance of the capacitor between the various test temperatures cannot be reflected at all.

[0003]By consulting relevant literature, it is found that there are some automatic measurements at present, and most of them use multiplexers to realize the gating of capacitors, but this method will affect the The test results bring large errors

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