Automatic testing system and testing method of temperature characteristics of capacitors
An automatic test system and temperature characteristic technology, applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve problems such as errors in capacitance parameter test results, and achieve the effect of saving manpower
Inactive Publication Date: 2014-03-12
TIANJIN UNIV
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[0003]By consulting relevant literature, it is found that there are some automatic measurements at present, and most of them use multiplexers to realize the gating of capacitors, but this method will affect the The test results bring large errors
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[0026] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0027] This project is divided into software part and hardware part.
[0028] The hardware part includes single-chip microcomputer, capacitor switching module, temperature sensor, LED array module and so on. The single-chip microcomputer adopts 51 series, and uses a total of 20 pins of P0, P1 and P2 ports to control the on-off of the relay. The capacitor switching module is the main hardware control module in the automatic test system. Its principle is to use the relay group as the selection switch of the capacitor path. Using a single-chip microcomputer as the control of the capacitor switching module, its main job is to communicate with the computer software terminal through the RS-232 serial port to receive instructions from the computer software terminal, and then "translate" the corresponding instructions into address com...
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The invention discloses an automatic testing system and a testing method of the temperature characteristics of capacitors. The automatic testing system comprises an upper computer, a single chip microcomputer, a capacitance switching module, a high-low temperature chamber, a temperature sensor, a Aglient capacitance bridge and tested capacitor sets, wherein the upper computer controls the single chip microcomputer according to a temperature signal; the single chip microcomputer controls a relay set of the capacitance switching module as a selection switch of a capacitance access so as to realize corresponding on-off connection of the Aglient capacitance bridge and the tested capacitor sets and automatically switch the connection between the Aglient capacitance bridge and tested capacitors, and thus the capacitance characteristic parameters of each tested capacitor set under the current temperature can be tested; the Aglient capacitance bridge continuously uploads test results to the upper computer through the single chip microcomputer; the upper computer realizes automatic acquisition of measurement data. According to the automatic testing system and the testing method, the automatic gating connection of the capacitance bridge and a plurality of capacitors can be realized in cooperation with the high-low temperature chamber, the temperature characteristics of the plurality of capacitors can be automatically measured, and thus labor is saved.
Description
technical field [0001] The invention relates to a capacitance automatic test system, in particular to an automatic test system aimed at the temperature characteristics of a capacitor. Background technique [0002] Previously, testing the temperature characteristics of capacitors was a very time-consuming process. Taking the measurement of the performance parameters of 20 capacitors in the temperature range of -55 to +155°C as an example, the basic process is as follows: firstly, set the temperature of the high and low temperature box to -55°C, and after the temperature in the high and low temperature box is stabilized, sequentially Adjust the band switch, measure the performance parameters of these 20 capacitors, and then manually record the test results. After the measurement at this temperature point is completed, change the temperature of the high and low temperature box according to the need, for example, adjust the temperature to -45°C. After the temperature is stable ...
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Inventor 肖谧尹昭杨辛睿山
Owner TIANJIN UNIV