Lens film thickness automatic detection system

Abstract

The invention relates to an lens film thickness automatic detection system which comprises an air pump 1, a two-dimensional motion platform bracket 2, a two-dimensional motion platform 3, a camera bracket 4, a light source 5, a camera 6, a sucker manipulator 7, a lens tray 8, a lens tray placing platform 9, an inferior grade box 10, a motion controller, a computer 12 and an inferior grade box bracket 13. For plated films with different thickness on a lens, the colors of images generated by the light source at the surface of the lens are different. According to the system, the camera 6 is used to shoot an image generated by the light source 5 on the lens, the computer processes the image through the related software, thus the thickness of the film is determined, and then the sucker manipulator 7 sorts inferior products. According to the system, the automatic batch detection of the lens film thickness is realized, and the detection speed and precision are greatly raised.

Description

technical field [0001] The invention relates to an automatic detection system for lens film thickness with fast detection speed and high precision. [0002] Background technique [0003] At present, my country is already the largest lens production country in the world, and the lens output of Jiangsu Danyang alone accounts for 40% of the world. However, my country's lens production and testing technology is relatively backward. Lens testing is an important part of lens production, but this backwardness is particularly prominent in the lens testing process. One of the inspection items is lens film thickness inspection, which is still mainly done manually at present. The main method is that workers judge whether the product is qualified by observing the color of the light source on the lens surface, and the manual inspection results will be affected by workers’ physiological differences, experience, Affected by many factors such as emotions and fatigue, coupled with the f...

AI Technical Summary

Problems solved by technology

[0004] Commonly used film thickness measurement methods include weighing method, capacitance method, resistance method, equal thickness interferometry, variable angle interferometry, ellipsometry, etc., such as the patent CN1432791 proposed a method by measuring the substrate produced by the electron beam bombardment film The current size is used to measure the film thickness. Patent CN202956092U proposes a method of measuring the film thickness of the lens using the principle of refraction, but it needs to be compared with the measurement data of the substrate, and the efficiency is low

There are also some special film thickness detection, although the detection accuracy is very high, but due to the complex principle, precise structure, slow speed and high cost, it is rarely used in industrial production.

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