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Thermal-image processing method capable of inhibiting effects of uneven thermal emissivity of material surface

A thermal emissivity and image processing technology, applied in image data processing, image enhancement, instruments, etc., to eliminate the interference of defect detection, improve detection accuracy, and suppress uneven thermal emissivity

Inactive Publication Date: 2014-03-19
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0011] The purpose of the present invention is to overcome the deficiencies of the prior art, and provide a thermal image processing method that can suppress the influence of uneven thermal emissivity on the surface of the material. By processing the infrared thermal image of the material, the uneven thermal emissivity existing on the surface of the material itself The impact of average, improve the accuracy of defect detection

Method used

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  • Thermal-image processing method capable of inhibiting effects of uneven thermal emissivity of material surface
  • Thermal-image processing method capable of inhibiting effects of uneven thermal emissivity of material surface
  • Thermal-image processing method capable of inhibiting effects of uneven thermal emissivity of material surface

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Embodiment

[0059] Figure 6 It is a photograph of stainless steel sample B. Such as Figure 6 As shown, the stainless steel sample B is the same as the stainless steel sample A, and the surface is equally spaced with light and dark stripes, and there is a crack in one of the bright stripes.

[0060] In this embodiment, eddy current is still used to heat the stainless steel sample B. Figure 7 is the infrared thermal image of stainless steel sample B at the end of heating. Such as Figure 7 As shown, the crack edge and the inside of the stainless steel sample B present different temperature states due to their own temperature differences, for example, the region PosB1 at the end of the crack and the region PosB2 at the side of the crack present a higher temperature than the inside of the crack; As in sample A, PosB4 in the black stripe area has a higher thermal emissivity, and the infrared thermal image brightness is higher, showing a high temperature, while the bright stripe area Pos...

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Abstract

The invention discloses a thermal-image processing method capable of inhibiting effects of uneven thermal emissivity of a material surface. Infrared thermal response amplitudes before starting of heating are subtracted from infrared thermal response amplitudes of different pixels in an infrared thermal image when cooling is over, and then the difference between infrared thermal response amplitudes of different pixels at any moment of a period from beginning of the heating to the end of the heating and the infrared thermal response amplitudes before the heating is subtracted from the result so that a new thermal infrared image is generated. The thermal infrared image generated through the method is capable of inhibiting effects of uneven thermal emissivity existing at a material surface on the thermal infrared image and avoiding interferences on defect detection and improving accuracy rate of defect detection.

Description

technical field [0001] The invention belongs to the technical field of thermal image processing, and more specifically relates to a thermal image processing method capable of suppressing the influence of uneven thermal emissivity on a material surface. Background technique [0002] In thermal imaging non-destructive testing, the presence or absence of defects is mainly determined by comparing the high and low temperatures of the thermal image at a specific moment. This method is highly susceptible to the uneven thermal emissivity of the material surface, which is a particularly serious problem in the detection of metallic materials. Such as oil, rust, water, etc. on the metal surface, due to the high thermal emissivity, it is very easy to generate false high temperature on the surface of the material, resulting in false detection and false alarm of defects. [0003] According to the Stefan-Boltzmann law, the power j radiated by a black body per unit area * It is proportion...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/50
Inventor 程玉华白利兵陈凯张杰
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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