Method for measuring bias and gain errors of time alternative ADC acquisition system

A technology of acquisition system and gain error, applied in the direction of analog/digital conversion calibration/test, etc., can solve the problems of channel mismatch, gain, offset and time offset error, etc.

Inactive Publication Date: 2014-03-19
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to various reasons such as ADC technology or circuit board layout and production, the sampling between multiple channels cannot be completely uniform, that is, channel mismatch occurs in each channel, and the channel mismatch of the TIADC acquisition system mainly comes from three types: Errors: Gain, Offset, and Time Offset Errors

Method used

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  • Method for measuring bias and gain errors of time alternative ADC acquisition system
  • Method for measuring bias and gain errors of time alternative ADC acquisition system
  • Method for measuring bias and gain errors of time alternative ADC acquisition system

Examples

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Embodiment

[0034] figure 1 It is a functional block diagram of the method for measuring the offset and gain errors of a time-alternating ADC acquisition system in the present invention.

[0035] In this example, if figure 1 As shown, let the input signal be x(t)=Acos(2πf in t+φ in ), where the magnitude of x(t) is A and the frequency is f in , the initial phase is φ in , the present invention measures the method for time-alternating ADC acquisition system offset and gain error, comprises the following steps:

[0036] (1), the signal is x(t)=Acos(2πf in t+φ in ) is input to the time-alternating ADC acquisition system, where, L is the number of FFT points, and L is the positive integer power of 2, that is, L=2 m , m is a positive integer, f s is the equivalent sampling rate of the system, P is a positive integer, and is relatively prime to L, that is, only one common divisor of L and P is 1, and the output signal x is processed by the TIADC acquisition system i (t), i=0,1,...,M-...

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Abstract

The invention discloses a method for measuring bias and gain errors of a time alternative ADC acquisition system. A cosine signal is inputted into the time alternative ADC acquisition system, at the same clock interval, the time alternative ADC acquisition system, under different sampling clock phases, performs parallel sampling through multipath parallel channels at the same sampling frequency, and then sampling output signals are subjected to the Fourier transformation to obtain frequency spectrum amplitude data, and when a time offset error is zero, the gain and bias errors of the channels are respectively calculated so that the gain and bias errors of the channels can be simply and rapidly determined, and error calibration is completed.

Description

technical field [0001] The invention belongs to the technical field of signal sampling, and more specifically relates to a method for measuring the offset and gain errors of a time-alternating ADC acquisition system. Background technique [0002] The multi-channel parallel ADC acquisition system can effectively improve the equivalent sampling rate of the system while ensuring high sampling accuracy. However, among all possible parallel ADC acquisition systems, the parallel ADC acquisition system based on time alternation, namely TIADC, is the simplest. kind of. Theoretically speaking, the highest achievable sampling rate of the TIADC acquisition system is only limited to: 1, the bandwidth of the input signal; 2, the maximum allowable power consumption of the system; 3, the maximum allowable space of the circuit board or integrated circuit. [0003] The TIADC parallel acquisition system has M parallel channels, and each channel uses the same ADC to realize parallel sampling ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
Inventor 郭连平王志刚罗光坤刘涛邓小飞
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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