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Detachable cathode test device

A test device, a detachable technology, applied in the field of detachable cathode test devices, can solve the problems of complex process, waste of cost for installing and imitating sample tubes, etc., and achieve the effect of convenient structure disassembly and assembly

Active Publication Date: 2016-04-06
KUNSHAN GUOLI VACUUM ELECTRIC
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Problems solved by technology

The disadvantage is that it can only be limited to single-point or multi-point local temperature measurement, and the second is that when the design temperature of the tube cathode needs to be adjusted, the experimental diode needs to be reinstalled, and the process is more complicated.
The second method is to install the simulated sample tube and seal the glass observation window to measure the temperature with an optical pyrometer. The temperature measurement range of this method is only limited to the visible range of the observation window. When the structure of the electron tube is more complicated and the cost is higher, it needs to be adjusted. The waste of the cost of installing the simulation sample tube in the cathode temperature design is obvious

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  • Detachable cathode test device

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Embodiment Construction

[0018] In conjunction with the accompanying drawings, the present invention is described in detail, but the scope of protection of the present invention is not limited to the following examples, that is, all simple equivalent changes and modifications made with the patent scope of the present invention and the content of the specification are still patents of the present invention. covered.

[0019] Such as figure 1 As shown, a detachable cathode test device includes a quartz bell jar 1, a support plate, an exhaust pipe 2 and an electrode assembly 3. The quartz bell jar is detachably arranged on the side of the support plate and forms a chamber for accommodating the temperature to be measured. In the sealed space 5 of the cathode workpiece 4, the exhaust pipe and the electrode assembly are respectively fixed on the support plate and communicate with the sealed space. Among them, the quartz bell jar is made of high-temperature-resistant quartz glass, and the exhaust pipe is co...

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Abstract

The invention discloses a detachable cathode test device which comprises a quartz clock cover, a support plate, an exhaust pipe and an electrode assembly, wherein the quartz clock cover is detachably arranged on the upper side surface of the support plate and forms a confined space used for accommodating a cathode workpiece of which the temperature needs to be measured; the exhaust pipe and the electrode assembly are respectively fixedly arranged on the support plate and communicated with the confined space. The detachable cathode test device can be repeatedly used so as to decrease the development cost of products.

Description

technical field [0001] The invention relates to a detachable cathode test device, which can be repeatedly used for testing the temperature and electrical performance of the hot cathode of an electric vacuum device. Background technique [0002] At present, there are two known hot cathode temperature measurement methods for electric vacuum devices in the electric vacuum industry. Method 1: Install the glass experiment diode internally and connect the thermocouple through the pins to convert the measured potential difference into the measured temperature with a professional instrument. The advantage of this method is that the influence of cathode material and process on cathode emission performance and life can be identified. The disadvantage is that it can only be limited to single-point or multi-point local temperature measurement. Secondly, when the design temperature of the tube cathode needs to be adjusted, the experimental diode needs to be reinstalled, and the process ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K11/00G01R31/00
Inventor 黄俊杰黄浩曹鸣坤张金贵李宗超
Owner KUNSHAN GUOLI VACUUM ELECTRIC