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Power supply service life detection method and system

A detection method and detection system technology, applied in the detection field, can solve the problem of inaccurate life time of the power supply, and achieve the effect of facilitating maintenance and replacement, improving accuracy, and reliable data information.

Inactive Publication Date: 2014-03-26
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

[0005] Based on this, it is necessary to provide a power supply life time detection method and system for the problem of inaccurate determination of power life time

Method used

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  • Power supply service life detection method and system
  • Power supply service life detection method and system
  • Power supply service life detection method and system

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Embodiment Construction

[0020] Various embodiments of the power supply life detection method and system of the present invention will be described in detail below.

[0021] like figure 1 As shown, it is a schematic flow chart of an embodiment of the power supply life detection method of the present invention, including:

[0022] Step S101: Obtain the effective test duration of each power supply in the high temperature test, and calculate the total test time of each power supply under test; wherein, the high temperature test is a test in which multiple power supplies of the same type under test are operated at a preset high temperature;

[0023] The high temperature test (also called the reliability test) can be carried out under simulated environmental stress conditions, using the high temperature acceleration method, and the acceleration temperature should be higher than the actual operating temperature of the circuit. The accelerated temperature should have a reasonable range, so that the circuit ...

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Abstract

The invention relates to a power supply service life detection method and a power supply service life detection system. The method comprises the steps of obtaining the effective test duration of each power supply in a high-temperature test and calculating total test time of all power supplies to be tested, wherein the high-temperature test is a test of operation of a plurality of power supplies with the same model at preset high temperature; when faulted power supplies occur during the test, obtaining the number of the faulted power supplies during the test and obtaining average fault interval time according to a ratio of the total test duration to the number of the faulted power supplies; calculating temperature acceleration coefficient, searching a confidence factor from a preset confidence factor table, and multiplying the confidence factor and the acceleration coefficient by the average fault interval time to obtain the service life of the power supplies to be tested. By adopting the scheme provided by the invention, the accuracy of determination of power supply service life is improved.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a method and system for detecting the life time of a power supply. Background technique [0002] Hybrid Integrated Circuit (HIC) refers to electronic devices used in space satellites, ground communication radars and other platforms that require long-term service and are difficult to repair and replace, such as solid state relays, DC / DC power supplies, etc., and their service period is usually 5 to 10 days. How to quickly, economically and scientifically evaluate this kind of hybrid circuit products with high reliability requirements, and obtain the working life data of the products in the platform environment (machine, ship, ground) has always been a problem for the production side. and problems that users need to solve urgently. A large number of DC / DC power supplies are used in various complete machine systems, and their life time data are used as the basic data for complete...

Claims

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Application Information

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IPC IPC(8): G01R31/40
Inventor 章晓文何小琦恩云飞
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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