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Spacer detection method, system and device

A spacer and infrared technology, applied in measuring devices, optical devices, instruments, etc., can solve problems such as complex optical systems, poor display whiteness, and high equipment maintenance costs

Inactive Publication Date: 2014-03-26
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] If the spacer cannot return to its original shape after being subjected to uneven force or external force, the substrates above and below the spacer are likely to shift, resulting in white defects in the display. Therefore, it is necessary to check the spacer. Detection to make adjustments to liquid crystal dispensing based on measured spacer thickness for better control of cell thickness
In the prior art, the detection of spacers is mainly through the CCD (Charge-coupled Device, that is, charge-coupled device) lens to obtain the image of the spacer, and then detect the unqualified spacer according to the gray value, but the detection The accuracy is not high, and the detection speed is relatively slow. Since the CCD lens acquires images under visible light, it is impossible to detect the internal structure of the spacer and the connection between it and the color filter substrate. Neither the interior nor the modulus of elasticity of the mat can be measured, so that after orientation and cell alignment, the cell thickness of the formed liquid crystal cell may not be the optimal cell thickness
In addition, the current detection equipment is complicated, and the marble machine and the lower anti-vibration table are used, and a high anti-vibration coefficient is required, that is, the requirements for detection conditions are relatively high.
[0004] Therefore, the equipment and method for detecting spacers in the prior art lead to inaccurate measurement results, which affects the quality of liquid crystal displays, the optical system is very complicated, and the equipment maintenance costs are large.

Method used

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  • Spacer detection method, system and device
  • Spacer detection method, system and device
  • Spacer detection method, system and device

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Experimental program
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Embodiment 1

[0050] In the first embodiment, a method for detecting septa is provided, and the steps are as follows: image 3 As shown, it specifically includes the following steps:

[0051] Step S1: The multiple sub-light sources emit infrared rays with different wavelengths and the same light intensity at non-overlapping timings, and the infrared rays are irradiated on the spacer.

[0052] Step S2: Time-sharing collection of infrared images formed by infrared rays of different wavelengths reflected by the spacer.

[0053] Step S3: Perform cumulative calculation on the light intensity of each pixel in the infrared image collected with different wavelengths to obtain the total light intensity of the entire image.

[0054] Step S4: The total light intensity calculated under different wavelengths is compared, and the distance between the spacers is calculated according to the infrared image corresponding to the maximum value of the total light intensity.

[0055] The above-mentioned detection method f...

Embodiment 2

[0066] The second embodiment of the present invention also provides a system for detecting septa. The composition diagram is as Figure 4 As shown, specifically including:

[0067] The light source 1, the imaging unit 2, the control unit 3, the light intensity accumulation unit 4, and the comparison calculation unit 5. The light source 1 provides multiple sub-light sources, which emit infrared rays with different wavelengths and the same light intensity at non-overlapping timing; the imaging unit 2 Used for time-sharing collection of infrared images formed by infrared rays of different wavelengths reflected by the spacer; the control unit 3 is connected to the light source 1 and the image capturing unit 2, and controls the multiple sub-light sources of the light source 1 to emit at different times Infrared rays with the same light intensity, and control the imaging unit 2 to collect the reflected infrared rays of different wavelengths; the light intensity accumulation unit 4 is co...

Embodiment 3

[0084] The third embodiment of the present invention also provides a device for detecting septa. The schematic diagram of the structure is as follows: Figure 5 As shown, specifically including the abutment, Figure 5 Not shown, the base is also provided with a horizontal guide rail 11, a vertical guide rail 12 and an infrared camera tube 13, wherein the infrared camera tube 13 is installed on the vertical guide rail 12 and also moves in the vertical direction along the vertical guide rail 12. Specifically, The infrared camera tube 13 is sleeved on the vertical guide rail 12, and the two ends of the vertical guide rail 12 slide in the horizontal direction on the horizontal guide rail 11, so as to realize the omni-directional scanning of the color film substrate by the infrared camera tube 13. The infrared camera tube 13 is The imaging unit in the system for detecting septa described in the second embodiment.

[0085] Preferably, the device in this embodiment further includes an ...

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PUM

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Abstract

The invention discloses a spacer detection method, system and device. The method includes the steps that a plurality of secondary light sources emit infrared rays different in wavelength and same in light intensity in a non-overlapped time sequence, and the infrared rays are shorn on spacers; infrared images formed by different wavelengths of infrared rays reflected by the spacers are collected in a time division mode; the light intensities of all the pixel points in the infrared images collected through different wavelengths are accumulated to obtain the total intensities of the whole images; the total light intensities obtained through calculation at different wavelengths are compared, and the distance between the spacers is calculated according to the infrared image corresponding to the largest total intensity. Infrared scanning is performed on the spacers on the basis of the infrared distance measurement principle, and the infrared rays reflected by the spacers in different positions are assembled to form the infrared images of a full color film substrate. The method is favorable for measurement of the box thickness of the spacers, a liquid crystal instilling machine is adjusted according to the spacer measurement data, the box thickness can be controlled better, and the display effect of a liquid crystal screen is improved.

Description

Technical field [0001] The invention relates to the field of display technology, and in particular to a method, system and device for detecting septa. Background technique [0002] Liquid crystal displays are commonly used flat panel displays, among which Thin Film Transistor-Liquid Crystal Display (TFT-LCD) is the mainstream product in liquid crystal displays. TFT-LCD usually includes an array substrate (TFT substrate) and a color filter substrate (CF substrate) arranged in a cell, and a liquid crystal layer is filled between the array substrate and the color filter substrate. At the same time, spacers are also arranged between the array substrate and the color filter substrate, and the spacers will support the thickness of the array substrate and the color filter substrate. The spacer is an important part of the liquid crystal display, and the height of the spacer determines the amount of liquid crystal that needs to be injected into the array substrate and the color filter su...

Claims

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Application Information

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IPC IPC(8): G02F1/13G01B11/14G01B11/06
Inventor 井杨坤林晓华
Owner HEFEI BOE OPTOELECTRONICS TECH