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Test system with interlayers and program testing method

A testing system and program testing technology, applied in software testing/debugging, program control devices, etc., can solve the problem of inability to achieve direct coupling between the middle layer and the AndroidUnit testing system, and achieve improved testing efficiency, scalability, and convenience. The effect of testers

Active Publication Date: 2014-03-26
TENCENT TECH (SHENZHEN) CO LTD
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  • Abstract
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Problems solved by technology

[0005] Specifically, take the AndroidUnit test system as an example, use the test system directly for testing, and its method call sequence is as follows figure 1 shown, from figure 1 It can be seen from the above that, in addition to the test case methods that need to be implemented, the extension points only have setup(), runBare() and teardown(), and the test class directly specifies the template parameters , if the tester wants to do a template parameter with the specified It is impossible to operate universally and extend an intermediate layer, so that it is impossible to decouple the intermediate layer from the AndroidUnit test system

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  • Test system with interlayers and program testing method

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Embodiment Construction

[0017] In order to further explain the technical means and effects adopted by the present invention to achieve the intended invention purpose, the specific implementation, structure, features and effects of the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0018] Such as figure 1 As shown, it is an operating environment diagram of the test system including the middle layer in the embodiment of the present invention. The test system 100 including the middle layer runs in the data processing device 1 , to be precise, the test system 100 including the middle layer runs in the data processing device installed with the development environment software 10 . The data processing device 1 also includes a processor 11, the processor 11 is used to start the development environment software 10, and run the test system 100 including the middle layer in the development environment software. The data proce...

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Abstract

The invention discloses a test system with interlayers. The test system is operated on a data processing device. The test system comprises a basic test class layer, a standard test class layer and a user layer. Between the standard test class layer and the user layer, the test system further comprises the first interlayer and the second interlayer, wherein the first interlayer is used for defining an abstract class which is inherited from a test class of the standard test class layer, the second interlayer is used for defining a test class which is inherited from the abstract class of the first interlayer, the specific test type is assigned through the test class, and the first interlayer is further used for achieving the aims that extension operation is inserted before a first test case in the test class of the second interlayer is executed, and extension operation is inserted after a final test case in the test class of the second interlayer is executed. According to the test system, the extendibility can be improved.

Description

technical field [0001] The invention relates to a test system and a program test method, in particular to a test system and a program test method including an intermediate layer. Background technique [0002] In the process of actual software development, continuous testing (for example, unit testing, integration testing and system testing, etc.) is required to check whether the developed software is qualified. Generally speaking, testers will use some kind of test system to test the developed software. Since the test system integrates many test interfaces, testers only need to write test cases to test the tasks that need to be tested (such as applications, User interface, etc.) to test, so that the test efficiency is improved, for example, the components are obtained through the Junit test system, and the correctness of sending events and detecting program processing is simulated. [0003] However, the API interface provided by the previous test system is relatively basic,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F9/44
Inventor 秦守强
Owner TENCENT TECH (SHENZHEN) CO LTD