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Factor analysis based ocular artifact removal method

A technique of ophthalmic artifact and factor analysis, applied in the field of neuroinformatics, can solve the problems of cumbersome individual differences and achieve good removal effect

Inactive Publication Date: 2014-04-16
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Claims
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Problems solved by technology

However, there is still a problem in these two methods that it is necessary to artificially judge which component is the oculoelectric component that needs to be removed, which is cumbersome and has large individual differences.

Method used

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  • Factor analysis based ocular artifact removal method
  • Factor analysis based ocular artifact removal method
  • Factor analysis based ocular artifact removal method

Examples

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Embodiment 1

[0024] (1) In this example, the EEG data recorded by the 32-lead EEG acquisition system is used (the sampling rate is 500Hz, and the data of 2s is selected), and the original data is subjected to some basic preprocessing (removing bad leads, removing drift) etc.) to obtain the EEG signals of each lead after preprocessing; at the same time, the synchronously recorded oculoelectric signals (EOG signals) were extracted.

[0025] (2) Decompose the EEG signal preprocessed in step (1) into factors (X=AF), obtain the decomposed factor matrix (F) of the EEG signal and its corresponding correlation coefficient matrix R, and use the correlation coefficient matrix R Calculate the corresponding loading matrix (in is the eigenvalue of the correlation matrix R, and U is the eigenvector corresponding to the eigenvalue).

[0026] (3) Calculate the correlation coefficient between the decomposed factors of the EEG signal and the synchronously recorded oculoelectric signal (EOG signal), and ...

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Abstract

The invention discloses a factor analysis based ocular artifact removal method. The method mainly includes: performing basic processing on electroencephalogram data and extracting a synchronously-recorded electro-oculogram (EOG); then extracting all factors in an electroencephalogram by means of factor analysis; combining with correlation analysis to solve a correlation coefficient of each factor with the synchronously-recorded electro-oculogram, and finding out the factor (determined as an ocular artifact factor) with the maximum correlation coefficient; after the ocular artifact factor is removed, restoring to obtain an electroencephalogram with ocular artifacts removed. By the method, the problem that ocular artifact components are judged artificially and subjectively in a traditional independent component analysis method is solved, and the maximum correlation coefficient is directly utilized to determine the ocular artifact factor; meanwhile, compared with the independent component analysis method, the method has the advantages that the electro-oculogram correlated factors can be found out better, the ocular artifacts can be removed better, and the method is of great significance to electroencephalogram analysis technology.

Description

technical field [0001] The invention relates to the field of neuroinformation science, in particular to a method for removing oculoelectric artifacts based on factor analysis. Background technique [0002] EEG signal is the use of sophisticated electronic equipment to record the spontaneous and rhythmic electrical activity of brain cell groups, which has the advantages of non-invasive, high time resolution and so on. However, because the EEG signal is a weak non-stationary signal (generally in the order of microvolts), it is particularly susceptible to interference from factors such as eye electricity, electrocardiography, and myoelectricity; among them, the eye electricity signal is the most important source of interference, and it is closely related to the brain. The doping of electrical signals brings a lot of inconvenience to the subsequent analysis of EEG signals, and also limits the research of EEG. Therefore, the removal of oculoelectric artifacts has always been a c...

Claims

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Application Information

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IPC IPC(8): A61B5/0496
Inventor 李凌谭波金贞兰
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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