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Color filter film thickness measurement method and device

The technology of a color filter and a measurement method is applied in the field of color filter film thickness measurement method and device, which can solve the problems that the color filter cannot be accurately distinguished and the detected pixel areas are different, so as to avoid the difference in measurement results , Eliminate the effect of measurement error

Active Publication Date: 2016-06-15
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The object of the present invention is to provide a color filter that can accurately distinguish the color type of the detected pixel area during the detection process and different detection personnel will get different detection results. Method and device for measuring color filter film thickness

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  • Color filter film thickness measurement method and device
  • Color filter film thickness measurement method and device
  • Color filter film thickness measurement method and device

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Embodiment Construction

[0033] The present invention is described below by means of the accompanying drawings and specific embodiments.

[0034] Such as figure 1 Shown is a schematic cross-sectional structure diagram of a color filter (ColorFilter) used in a TFT-LCD. The color filter includes a glass substrate 100 on the bottom layer, and a layer of opaque black matrix 400 (blackmatrix, BM) is formed on the glass substrate 100 by deposition, coating, etc. Pixel cells of different colors, for example in figure 1 includes red pixel 201 (Rpixel), blue pixel 202 (Bpixel) and green pixel 203 (Gpixel) arranged repeatedly in order. A layer of indium tin oxide 300 (ITO) is covered on these pixel units and the black matrix 400 . When different colors need to be displayed, the TFT circuit corresponding to each pixel unit controls whether it transmits light. Obviously, the thickness of each pixel unit will greatly affect the quality of displayed colors, and the thickness of the black matrix 400 will affect ...

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Abstract

A method and an apparatus for measuring the film thickness of a color filter. The method comprises the following steps: S1: photographing a color filter by using a color camera to obtain a color image of the color filter; S2: performing color gradation matching on the collected color image to recognize different color regions and a background region in the color image; and S3: locating and measuring the center of each of the color regions, and measuring the central film thickness of each of the color regions and the film thickness of the background region. By implementing the method and apparatus for measuring the film thickness of the color filter, regions of different R, G and B colors on the color filter can be accurately recognized, the measurement result difference caused by different measurement regions selected by measurement personnel is avoided by measuring center positions of the color regions, and a measurement error caused by unevenness of placement of the detected color filter can also be eliminated.

Description

technical field [0001] The invention relates to liquid crystal display manufacturing technology, more specifically, to a method and device for measuring the film thickness of a color filter. Background technique [0002] The RGB (Red, Green, Blue) process is the key to the color formation of TFT-LCD panels. In the production of color filters (ColorFilter), the color quality is guaranteed by controlling the film thickness of the RGB photoresist film. There are three main methods for RGB film thickness measurement: contact probe measurement, optical 3D modeling, and optical refraction conversion. Among them, optical 3D modeling has been more and more applied in the TFT-LCD industry due to its advantages of various measurement types, high measurement flexibility, good stability and reliability, and fast measurement speed. The integrated measuring and measuring all-in-one machine can effectively reduce the cost of equipment. [0003] The existing optical 3D measurement method ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/06
CPCG01B11/0675
Inventor 黄文德
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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