Semi-contact curved surface three-dimensional size measuring device and measuring method thereof

Abstract

The invention relates to a semi-contact curved surface three-dimensional size measuring device and a measuring method thereof, and relates to the technical field of three-dimensional dimension measurement of a curved surface. The measuring device comprises an upper fixing claw, a lower fixing claw, a driving fixing device and a capacitive grating laser measuring device; the upper fixing claw is mounted above the driving fixing device, and the lower fixing claw is mounted below the driving fixing device; and the upper fixing claw and the lower fixing claw have the same structure; the two fixingclaws move up and down according to the measurement requirements of the measured curved surface to adjust the clamping position, which adapts to the clamping requirements of different measured curvedsurfaces; the capacitive grating laser measuring device is movably connected with the driving fixing device, the capacitive grating laser measuring device is used for measuring the three-dimensionalsize of the measured curved surface, and the driving fixing device drives vertical motion of the capacitive grating laser measuring device. The positioning accuracy, measurement accuracy, data repeatability and the like of the measuring device are greatly improved compared with the non-contact measuring device, and can be used for measuring places with high precision requirements; and the method can measure continuous curved surfaces and has high measuring efficiency.

Description

technical field [0001] The invention relates to the technical field of three-dimensional dimension measurement of arc surfaces, in particular to a semi-contact three-dimensional dimension measurement device for arc surfaces and a measurement method thereof. Background technique [0002] With the continuous development of science and technology and the continuous growth of industrial demand, more and more surface digitalization problems are emerging in machinery manufacturing, rail transit, home appliances, medical equipment, cartoon animation, handicrafts and other industries. Non-contact measurement is currently a widely used solution, and three-coordinate measurement methods are also used in fields that do not require continuous measurement. [0003] Chinese patents with application numbers CN200410022111.9, CN93238983.X, CN200810059148.7, and CN201610070408.5 disclose various devices and methods for measuring curved surfaces using laser measurement methods. Chinese paten...

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Problems solved by technology

[0006] In order to solve the existing non-contact measurement methods, such as the difficulty in precise positioning, low measurement accuracy, and poor repeatability, and the technical problems of inability to measure continuous curved surfaces and low measurement efficiency in contact measurement methods, the present invention provides a semi- The contact-type three-dimensional dimension measuring device and its measuring method for curved surfaces have greatly improved indicators such as positioning accuracy, measurement accuracy, and data repeatability compared with non-contact measuring devices, and can be used in measurement places with high precision requirements; at the same time, the The method is capable of measuring continuous surfaces with high measurement efficiency

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