Direct calibration method for line structured light vision sensor

A visual sensor and line structured light technology, applied in the direction of instruments, optical devices, measuring devices, etc., can solve the problems of complex sensor calibration methods and low precision, and meet the application requirements of small field of view high-precision measurement, high precision, and easy Achieved effect
CN103884271AInactive Publication Date: 2014-06-25SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
4 Cites 39 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
Publication Date
2014-06-25
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention relates to a direct calibration method for a line structured light vision sensor. The method comprises the following steps: establishing a target formed through standard gauge blocks and by utilizing a three-dimensional precision translation bench; projecting structured light plane to the target through the line structured light vision sensor to form feature points on the target; establishing a space coordinate system on the target; collecting target images and extracting the feature points; establishing a search index table including establishing a direct mapping relation between image coordinates of the feature points and space coordinate system coordinates of the feature points; carrying out calibration on the line structured light vision sensor; and based on the image coordinate of a point to be calibrated, searching the space coordinate system coordinate, which is obtained directly or obtained by utilizing a least squares fitting method, of the point in the search index table, so that the direct calibration of the line structured light vision sensor can be realized. The calibration method is used for the line structured light vision sensor which belongs to the small vision field high precision measurement application field. The calibration method is simple and direct, easy to realize, high in precision and can meet the need of measurement.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to the application field of computer vision technology, and relates to a line structured light vision measurement system, in particular to a line structured light vision sensor calibration method in the application field of small field of view high precision measurement. Background technique

[0002] Line structured light vision measurement technology has the characteristics of high measurement accuracy, large amount of information, high sensitivity, good real-time performance, and strong anti-interference ability. It has been widely used in industrial measurement, 3D reconstruction, reverse engineering and other fields.

[0003] At present, the traditional calibration methods of line structured light sensors mainly adopt model calibration methods, mainly including target calibration method, differential method, blanking point method, mechanical adjustment method, filament scattering method, cross-ratio invariant method, etc. [0...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More