A sample stage installed on a powder x-ray diffractometer to test solid block samples

Abstract

The invention relates to a sample platform mounted on a powder X-ray diffractometer and used for testing a solid block-shaped sample. The sample platform is provided with a sample groove for containing a sample. The sample platform is characterized in that the sample groove is internally provided with glass powder for fixing the sample, and a gap between the sample and the sample groove is filed with the glass powder. According to the sample platform provided by the invention, plasticine in the prior art can be relatively well replaced so as to remove interferences caused by the diffraction peak of the plasticine. Furthermore, the complicated operations that a traditional sample platform is provided with a supporting piece, and the sample and a supporting frame need to be fixed at the same time in the operation process are avoided; the sample platform can be used for testing the thick block-shaped sample.

Description

【Technical field】 [0001] The invention relates to a sample stage installed in a powder X-ray diffractometer for testing solid block samples. 【Background technique】 [0002] Powder X-ray diffractometer is a large precision instrument for testing the phase and relative content of powder samples. Widely used in material science, geology, chemical industry, metallurgy, ceramics and pharmaceutical industries. When using powder X-ray diffractometer for measurement, the traditional method needs to grind the sample into powder before testing. The X-ray diffractometers in the prior art all use three contacts on the goniometer sample holder to contact the reference plane of the sample stage to determine the sample test surface, and the sample stage remains stable and does not rotate during the test. Most manufacturers provide shallow glass sample tanks for testing powder samples, which cannot be used for testing solid block, sheet samples, irregular samples and samples that are not ...

AI Technical Summary

Problems solved by technology

[0003] Liu Qiuchao and others improved the sample holder of the X-ray diffractometer. For small-sized block samples or film samples, plasticine was added to the back of the sample, and the method of pressing the sample holder with a glass sheet was fixed. By cutting the sample holder, It makes it easy to fix and measure large-sized samples, but since the plasticine will also produce diffraction during the test, the diffraction peak of the plasticine will inevitably be introduced during the test; Chinese patent ZL200720174416.0 discloses a convenient The diffractometer sample stage for testing thin flake solid samples. This patent is realized by adding supports to the traditional sample stage. During the operation, both the sample and the support frame must be fixed. The operation is cumbersome and thicker samples cannot be measured. Block sample; Chinese patent ZL200420092151.6 and Chinese patent CN201653939U disclose a solid block sample holder for X-ray diffractometer, which is realized by pressing the sample to the reference baffle frame of the sample test surface through a spring installed in the middle of the base Yes, this sample stage is more suitable for block sample testing, but it needs to have a reference baffle on the sample test surface, and there are many parts of the sample stage, the production requirements are high, and it will cause cutting damage to the sample

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