Method for obtaining dielectric constant of PCB materials
A technology of dielectric constant and dielectric layer, applied in the direction of measuring electrical variables, measuring resistance/reactance/impedance, measuring devices, etc.
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[0041] Embodiments of the present invention are described in detail below:
[0042] Such as figure 1 As shown, it is a schematic diagram of an impedance test pattern with a microstrip line according to an embodiment of the present invention. Obtain the method for PCB material dielectric constant of the present invention, comprise the steps:
[0043] Etch the impedance test pattern on the PCB substrate, wherein, the impedance test pattern includes the pad 12 electrically connected to the end of the microstrip line 11 and the microstrip line 11, and the pad 12 has a test hole 13, through which the impedance test pattern The measured impedance value Z is more accurate.
[0044] Obtain the impedance value Z of the microstrip line 11, and obtain the line width W of the microstrip line 11, the thickness T of the copper foil of the microstrip line 11, and the thickness H of the dielectric layer 10 connected to the impedance test pattern; The impedance value Z of the microstrip lin...
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Abstract
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