Eye-open monitor device for high-speed serializer/deserializer and testing method

Abstract

The invention provides an eye-open monitor device. According to the eye-open monitor device, when signal eye pattern testing is achieved, two eye-open measuring clocks with identical frequency with signals are utilized to test opening sizes of an eye patterns on arranged phase points; threshold value sizes are set and the phases of the measuring clocks are set in half period; whether the set threshold value sizes are located inside the eye patterns at the positions of the measuring clocks is judged, and the largest threshold value inside the eye patterns is the open size of the eye patterns at a clock phase point; the open size results of the eye patterns at all the phase points are stored into registers, the values of the registers are arranged in sequence after all the phase points are tested, and the horizontal open size and the vertical open size of the signal eye patterns are obtained. Compared with the prior art, the eye-open monitor device has the advantages that synchronous operation of an initial clock and data is not needed, setting of a testing process and recording of testing results are completed automatically through a digital control module, and the information of open sizes of the signal eye patterns in one period can be obtained.

Description

technical field [0001] The invention relates to the design field of an eye pattern test circuit for high-speed signals in a high-speed serializer / deserializer system, in particular to an eye-opening monitor device and a testing method for a high-speed serializer / deserializer. Background technique [0002] When serial data is transmitted in the link, due to the unsatisfactory overall transmission characteristics of the system (including the characteristics of the equalizer and the channel), the waveforms of the preceding and following symbols are distorted and broadened, and the previous waveforms have a long tail, which affects the The sampling moment of the current symbol causes interference to the judgment of the current symbol, which is the so-called intersymbol interference phenomenon. As the data rate increases, the phenomenon of intersymbol interference becomes more significant. Generally, the data eye diagram is used to measure the amount of intersymbol interference....

AI Technical Summary

Problems solved by technology

[0006] The eye opening monitor based on edge data monitors the opening of the eye diagram by checking the edge of the data. Edge monitoring usually requires dense sampling, and the results obtained are represented by histograms. Larger, but when the data rate is too high, it will become difficult to measure the eye diagram with an eye-opening monitor based on edge data due to the limitation of the sampling clock frequency

[0007] The multi-sampling eye-opening monitor samples the vertical opening size of multiple phase points in one cycle of data through a large number of samples in each cycle, which requires the design of a very accurate phase rotator, and the monitoring of the multi-sampling eye-opening monitor Is the most comprehensive, but its hardware design complexity is the largest

[0008] Since the one-dimensional eye-opening monitor can only measure the vertical opening size of the eye diagram, and the eye-opening monitor based on edge data is limited by the increase in sampling frequency for high-rate data, the multi-sampling eye-opening monitor requires very accurate The phase rotator and multi-phase point sampling, and the test of the eye diagram of the two-dimensional eye-opening monitor depends on the selection of the mask, it can only test the set mask, and the test result can only indicate whether the given mask is available , the final eye diagram requires a lot of mask setting and testing, which is time-consuming and labor-intensive

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