Long-wavelength scanning near-field microscopic analysis system

A technology of microscopic analysis and scanning near-field, applied in the field of scanning near-field microscopic analysis system, which can solve the problems of narrow frequency band and limited coverage.

Active Publication Date: 2014-07-30
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

[0007] However, in the prior art, most of the long-wave light waves used are only limited to broadband terahertz waves, the frequency band is relatively narrow, the coverage is very limited, and there are almost no single-frequency terahertz waves
In addition, in the long wavelength band, there is no scanning near-field microscopy device with simultaneous variable electric field, magnetic field and temperature field.

Method used

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Embodiment Construction

[0029] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that, in the drawings or descriptions of the specification, similar or identical parts all use the same figure numbers. Implementations not shown or described in the accompanying drawings are forms known to those of ordinary skill in the art. Additionally, while illustrations of parameters including particular values ​​may be provided herein, it should be understood that the parameters need not be exactly equal to the corresponding values, but rather may approximate the corresponding values ​​within acceptable error margins or design constraints. The directional terms mentioned in the embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the...

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Abstract

The invention provides a long-wavelength scanning near-field microscopic analysis system. The long-wavelength scanning near-field microscopic analysis system integrates broadband long-wavelength and single-frequency THz waves, utilizes a scanning probe to integrate a variable electric field, a variable magnetic field and a variable temperature field, fills the technical blank of long-wavelength wave bands in the near-field microscopy field, enables a near-field optic microscopic technology to be linked with a near-field microwave microscopic technology and provides an all-around sample physical property testing tool for scientific research persons.

Description

technical field [0001] The present invention relates to the technical field of microanalysis, in particular to a scanning near-field microanalysis of a long-wavelength band (100-30000 GHz) which utilizes a near-field scanning probe and integrates a variable electric field, a variable magnetic field, and a variable temperature field. system. Background technique [0002] Long wavelength refers to the electromagnetic spectrum with frequencies ranging from 100 Hz to 30000 GHz, including the terahertz (0.1-10 THz) band. This band has high temporal and spatial coherence. Unlike traditional imaging methods that only record intensity, the time-domain spectroscopy technology developed in combination with THz time-domain pulse characteristics directly records the amplitude time waveform of the electric field, and obtains its amplitude at the same time through Fourier transform. And the spectral distribution of the phase, one imaging can get a variety of information about the sample ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/18
Inventor 陆亚林杨蒙蒙黄秋萍胡翔陆轻铀
Owner UNIV OF SCI & TECH OF CHINA
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