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Detector pixel response nonuniform error correction device and correction method thereof

A detector pixel and error correction technology, applied in the field of laser detection, can solve problems such as inability to meet high-precision measurement, and achieve the effects of high-efficiency speckle suppression method, high light field uniformity, and high-precision laser measurement

Active Publication Date: 2014-08-13
INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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  • Abstract
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  • Application Information

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Problems solved by technology

However, highly coherent lasers will form speckles in space, which cannot meet the requirements of high-precision measurement

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  • Detector pixel response nonuniform error correction device and correction method thereof
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  • Detector pixel response nonuniform error correction device and correction method thereof

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Embodiment Construction

[0027] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Elements and features described in one drawing or one embodiment of the present invention may be combined with elements and features shown in one or more other drawings or embodiments. It should be noted that representation and description of components and processes that are not related to the present invention and known to those of ordinary skill in the art are omitted from the drawings and descriptions for the purpose of clarity. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the ar...

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Abstract

The invention discloses a detector pixel response nonuniform error correction device and a correction method thereof, the device includes a laser light source component, a coupling lens, optical fiber, a container and a black box which are arranged in sequence; the container is provided with a scattering medium solution, the optical fiber inserts into the scattering medium solution, the black box is provided with a detector to be corrected, and the detector to be corrected is connected with a signal acquisition and processing module. The correction method is as follows: alignment laser emitted by the laser light source component is focused to the optical fiber by the coupling lens, the laser is led into the scattering medium solution by the optical fiber from an incident end face, volume scattering of the laser is performed in the scattering medium solution, scattered light is transmitted into the black box from an outgoing end face to form a uniform light field in the position of the detector to be corrected; and the signal acquisition and processing module acquires and processes the test data to obtain correction. By use of the detector pixel response nonuniform error correction device, detector pixel response nonuniform correction wavelength can be matched with actual laser measurement system laser wavelength, so that high accuracy laser measurement can be realized.

Description

technical field [0001] The invention relates to the field of laser detection, in particular to a detector pixel response non-uniform error correction device and a correction method thereof. Background technique [0002] In high-precision laser measurement equipment, area array pixel detectors are commonly used to measure the distribution changes of optical signals. High-precision measurement means that area array pixel detectors must be able to sensitively respond to weak changes in optical signals. However, limited by the precision of semiconductor processing technology, the error of most area array pixel detectors is relatively serious, especially the non-uniform error of pixel photoelectric response, that is, under the same lighting conditions, the output signals of different pixels are different, which will distort the Changes in the light field in actual measurements. For example, in the long-range surface profiler, a surface profile detection equipment for synchrotron...

Claims

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Application Information

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IPC IPC(8): G01N21/00G01B11/24
Inventor 杨福桂李明盛伟繁
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACADEMY OF SCI
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