The invention discloses a white light interference and laser scanning-based morphology measurement device comprising a three dimensional motion platform and a white light-laser measurement system positioned on the same. The measurement system comprises a white light source 1, three light splitting prisms, a microscopic ocular lens 5, a microscopic object lens 6, an interference object lens 7, a four-quadrant photoelectric sensor 8, a laser device 9 and an image sensor 10; two measurement optical paths and a laser measurement optical path are provided; the laser optical path has the following structure: light sent via the laser device 9 is turned via a third light splitting prism 4, and then the light is focused onto a surface 11 being measured via the microscopic object lens 6; the light passes through the microscopic object lens 6, the third light splitting prism 4, and a second light splitting prism 3 after being reflected by the surface 11 being measured; then the light is projected to the four-quadrant photoelectric sensor 8 and is used for measuring height information of the surface 11 being measured; light, reflected back by the surface 11 being measured, sent via the laser device 9 is turned via the second light splitting prism 3; after passing through a first light splitting prism 2 and the microscopic ocular lens 5, the light and illumination backlight formed via the white light source 1 are imaged onto the image sensor 10, and a collection image for laser measurement is formed.