Attenuation sampling device used for large-angle high-energy laser incidence
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NORTHWEST INST OF NUCLEAR TECH
- Publication Date
- 2014-09-03
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Abstract
Description
technical field
[0001] The invention relates to a method for high-energy laser large-angle measurement, in particular to a device for sampling high-energy laser large-angle attenuation by using volume scattering materials. Background technique
[0002] In the measurement of high-energy laser parameters, the photodetector array sampling method is often used to obtain the temporal and spatial distribution information of laser spot power density. Since the laser power density at the test position is generally high, it is difficult to directly use the photodetector array to measure, so in the actual test, the measured laser power density needs to be reasonably attenuated to meet the range of the photodetector. scope.
[0003] The far-field laser transmitted through the atmosphere usually enters the photodetector array at a certain angle. Due to the uncertainty of atmospheric transmission and the diversity of high-energy laser use, it is necessary to ensure that the photodetecto...