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Pulse type power mode LED voltage-current-junction temperature characteristic testing device

A pulsed current and power type technology, applied in the field of light-emitting diode characteristic testing devices, can solve the problems of measurement error, affecting the signal-to-noise ratio of the test signal, etc., and achieve the effects of improving accuracy, reducing self-heating effect and high stability

Inactive Publication Date: 2014-09-03
XIAMEN UNIV
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the traditional electrical test method, in order to reduce the self-heating effect of the test current, the test current should be as small as possible, but too small test current will affect the signal-to-noise ratio of the test signal
Also, virtually any magnitude of test current will generate heating effects, introducing measurement errors

Method used

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  • Pulse type power mode LED voltage-current-junction temperature characteristic testing device

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Embodiment Construction

[0017] The following embodiments will further illustrate the present invention in conjunction with the accompanying drawings.

[0018] see Figure 1~3 , The embodiment of the present invention is provided with a fixture 2, a temperature control module 3, a pulse current source 4, a digital control module 5, a data acquisition module 6, a precision sampling resistor 7, and a computer 8.

[0019] The LED1 to be tested is installed on the fixture 2, the temperature control module 3 is connected with the digital control module 5 for setting temperature and feedback temperature, the temperature control module 3 is connected with the fixture 2 for heating or cooling and monitoring temperature, the The pulse current source 4 is connected to the digital control module 5 for setting pulse parameters, the pulse current source 4 is connected to one end of the precision sampling resistor 7, and the other end of the precision sampling resistor 7 is connected to the LED1 to be measured; the...

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PUM

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Abstract

The invention discloses a pulse type power mode LED voltage-current-junction temperature characteristic testing device and relates to a light emitting diode characteristic testing device. The device is provided with a clamp, a temperature control module, a pulse current source, a digital control module, a data collecting module, a precise sampling resistance and a computer, wherein a to-be-tested LED is installed on the clamp, the temperature control module is connected with the digital control module for setting and feeding temperature back, the temperature control module is connected with the clamp for heating or refrigerating and monitoring temperature, the pulse current source is connected with the digital control module for setting pulse parameters, the pulse current source is connected with one end of the precise sampling module and the other end of the precise sampling module is connected with the to-be-tested LED; both ends of the precise sampling module and the to-be-tested LED are connected with the data collecting module for collecting current and end voltage passing through the to-be-tested LED; the data collecting module is connected with the digital control module for data feedback, and the digital control module is connected with a computer through a USB.

Description

technical field [0001] The invention relates to a light-emitting diode characteristic test device, in particular to a pulsed power type LED voltage-current-junction temperature characteristic test device. Background technique [0002] A light-emitting diode (Light-Emitting Diode, LED) is a device widely used in the semiconductor lighting industry. Due to the limitations of the current technical level of materials, packaging and processes, the heat dissipation problem of LED devices is prominent, and its operating voltage, current and junction temperature characteristics seriously affect the performance of LEDs (including luminosity, chromaticity and electrical parameters, etc.), which is also a decision An important parameter of LED photoelectric characteristics and lifetime. [0003] At present, the detection method of voltage-current-junction temperature characteristics of LED has infrared thermal imaging method (Feng Shiwei, Xie Xuesong, Lu Changzhi. Electrical method me...

Claims

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Application Information

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IPC IPC(8): G01R31/26
Inventor 范贤光王昕许英杰吴景林阙靖
Owner XIAMEN UNIV
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