Three-dimensional semiconductor device and manufacturing method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INST OF MICROELECTRONICS CHINESE ACAD OF SCI
- Publication Date
- 2018-03-30
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Abstract
Description
technical field
[0001] The invention relates to a semiconductor device and a manufacturing method thereof, in particular to a three-dimensional semiconductor storage device and a manufacturing method thereof. Background technique
[0002] In order to improve the density of memory devices, the industry has made extensive efforts to develop methods of reducing the size of two-dimensionally arranged memory cells. As the size of memory cells in two-dimensional (2D) memory devices continues to shrink, signal collisions and interference can increase significantly, making it difficult to perform multi-level cell (MLC) operations. In order to overcome the limitations of 2D memory devices, the industry has developed memory devices with a three-dimensional (3D) structure to increase integration density by three-dimensionally arranging memory cells on a substrate.
[0003] Specifically, a multilayer stack structure (for example, a plurality of ONO structures alternating with oxides an...