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Circuit for testing admittance and phase angle of secondary circuit through pilot frequency admittance method

A technology for secondary circuits and testing circuits, applied in the phase angle between voltage and current, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as electromagnetic signal interference, and achieve high safety and simple circuits Reliable and stable effect

Active Publication Date: 2014-09-17
国网山东省电力公司营销服务中心(计量中心) +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, the secondary circuit monitoring of the current transformer (TA) mainly uses the power frequency signal to measure and monitor the secondary side of the transformer. However, when the power frequency signal detects the secondary side signal, it is easily affected by electromagnetic waves generated by other equipment in the substation. Signal interference. For this reason, many scholars at home and abroad have proposed a method for detecting the secondary circuit impedance of current transformers with different frequency signals, and this method has been completely proved in theory, and can be prepared to test the secondary circuit impedance of current transformers. Impedance, and not interfered by the electromagnetic field generated by the power frequency signal current, based on this, we propose a circuit with simple circuit structure and easy implementation for testing the admittance and phase angle of the secondary circuit by the different frequency admittance method

Method used

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  • Circuit for testing admittance and phase angle of secondary circuit through pilot frequency admittance method
  • Circuit for testing admittance and phase angle of secondary circuit through pilot frequency admittance method
  • Circuit for testing admittance and phase angle of secondary circuit through pilot frequency admittance method

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Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the drawings:

[0023] Such as Figure 4 As shown, a circuit for testing the admittance and phase angle of the secondary loop by the different frequency admittance method includes: the current test circuit in the secondary loop, the voltage test circuit at both ends of the secondary loop, and the conductance of the secondary loop Nano and phase angle test circuit.

[0024] Such as figure 1 As shown, the current test circuit in the secondary loop is an inverse proportional arithmetic circuit. The inverted proportional arithmetic circuit is composed of a resistor R1, a resistor R2 and an operational amplifier U1. The negative input of the operational amplifier U1 and The output terminal of the secondary loop is connected, the negative input terminal of the operational amplifier U1 is also connected to the output terminal of the operational amplifier U1 through a resistor R1, and the output terminal of...

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PUM

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Abstract

The invention discloses a circuit for testing admittance and a phase angle of a secondary circuit through a pilot frequency admittance method. The circuit comprises a secondary circuit, wherein one end of the secondary circuit is connected with a pilot frequency single source, the other end of the secondary circuit is connected with a current test circuit, and the two ends of the secondary circuit are further connected with a voltage test circuit. A signal reflecting the current which is measured by the current test circuit in the secondary circuit and a signal reflecting the needed secondary circuit end voltage measured by the voltage test circuit serve as the input signals of the admittance and phase angle test circuit, and the admittance and phase angle test circuit output the admittance amplitude and the phase position amplitude of the secondary circuit. The circuit for testing the admittance and the phase angle of the secondary circuit through the pilot frequency admittance method has the advantages of being clear in functions of all parts of the circuit, easy to implement, capable of testing the admittance and the phase angle of the secondary circuit, less in components, simple in circuit, good in stability, high in safety and the like.

Description

Technical field [0001] The invention relates to the field of power electronics, and relates to a circuit for testing the admittance and phase angle of a secondary circuit, and in particular to a circuit for testing the admittance and phase angle of a secondary circuit using an inter-frequency admittance method. Background technique [0002] With the development of society, the improvement of living standards and the rapid increase of various power consumption, the application of gateway electric energy metering devices has also increased. The gateway electric energy metering devices generally include voltage transformers (TV) and secondary circuits, and current transformers. (TA) and secondary circuits, electric energy meters, etc., which are distributed in power plants, substations or direct power users. The technical supervision and management of the gateway electric energy metering device is generally supervised and managed by various provincial electric power test institutes....

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/08G01R25/00
Inventor 杨剑常亮张晓东李永伟王运全曲效武
Owner 国网山东省电力公司营销服务中心(计量中心)