Circuit for testing admittance and phase angle of secondary circuit through pilot frequency admittance method
A technology for secondary circuits and testing circuits, applied in the phase angle between voltage and current, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as electromagnetic signal interference, and achieve high safety and simple circuits Reliable and stable effect
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[0022] The present invention will be described in detail below in conjunction with the drawings:
[0023] Such as Figure 4 As shown, a circuit for testing the admittance and phase angle of the secondary loop by the different frequency admittance method includes: the current test circuit in the secondary loop, the voltage test circuit at both ends of the secondary loop, and the conductance of the secondary loop Nano and phase angle test circuit.
[0024] Such as figure 1 As shown, the current test circuit in the secondary loop is an inverse proportional arithmetic circuit. The inverted proportional arithmetic circuit is composed of a resistor R1, a resistor R2 and an operational amplifier U1. The negative input of the operational amplifier U1 and The output terminal of the secondary loop is connected, the negative input terminal of the operational amplifier U1 is also connected to the output terminal of the operational amplifier U1 through a resistor R1, and the output terminal of...
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