Multi-station MEMS gyro testing socket

A technology for testing sockets and gyroscopes, applied to instruments, measuring devices, etc., can solve problems such as inaccurate positioning, electrostatic adsorption, and difficulty in taking out products, and achieve the effect of improving test accuracy and speed and improving work efficiency

Inactive Publication Date: 2014-09-24
SUZHOU CHUANGRUI MACHINERY & ELECTRICAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The test sockets currently on the market use SEMI-CONTACTOR probes (POGO PIN) for testing, but due to their inherent design defects, during the multi-station testing process, it often occurs that it is difficult to take out the product, the positioning is inaccurate, and electrostatic adsorption. Even in bad situations such as short circuit, the test efficiency is not always high

Method used

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  • Multi-station MEMS gyro testing socket
  • Multi-station MEMS gyro testing socket

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Embodiment Construction

[0021] The implementation of the present invention will be illustrated by specific specific examples below, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0022] see figure 1 , 2 . It should be noted that the structures, proportions, sizes, etc. shown in the drawings attached to this specification are only used to match the content disclosed in the specification, for those who are familiar with this technology to understand and read, and are not used to limit the implementation of the present invention. Limiting conditions, so there is no technical substantive meaning, any modification of structure, change of proportional relationship or adjustment of size, without affecting the effect and purpose of the present invention, should still fall within the scope of the present invention. The disclosed technical content must be within the scope covered. At the same time,...

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Abstract

The invention provides a multi-station MEMS gyro testing socket which comprises an upper pressing plate and a base. The base is pressed by the upper pressing plate. The multi-station MEMS gyro testing socket is characterized in that a floating plate containing groove is formed in the base, a floating plate is arranged in the floating plate containing groove, an elastic piece is arranged at the bottom of the floating plate, a plurality of element containing grooves are formed in the floating plate, a plurality of protrusions corresponding to the element containing grooves in position are arranged on the upper pressing plate, a plurality of sets of probes are arranged on the base, the upper ends of the multiple sets of probes movably penetrate through the floating plate and are located in the element containing grooves respectively, and the lower ends of the multiple sets of probes are connected with an adapter PCB. By means of the multi-station MEMS gyro testing socket, the testing accuracy of an MEMS gyro can be effectively improved, the testing speed of the MEMS gyro can be effectively increased, and the working efficiency is improved.

Description

technical field [0001] The invention relates to a gyroscope test socket, in particular to a socket capable of testing MEMS gyroscopes at multiple stations. Background technique [0002] Micro-Electro-Mechanical System (MEMS, Micro-Electro-Mechanical System) is an advanced manufacturing technology platform. It is developed on the basis of semiconductor manufacturing technology. MEMS technology uses a series of existing technologies and materials such as lithography, corrosion, and thin film in semiconductor technology. Therefore, from the perspective of manufacturing technology itself, the basic manufacturing technology in MEMS is mature. However, MEMS focuses more on ultra-precision machining, and involves many disciplines such as microelectronics, materials, mechanics, chemistry, and mechanics. Its discipline has also expanded to various branches of physics such as force, electricity, light, magnetism, sound, and surface at the microscale. [0003] Gyroscopes with variou...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
CPCG01C25/005
Inventor 朱小刚
Owner SUZHOU CHUANGRUI MACHINERY & ELECTRICAL TECH
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