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2results about How to "Solve the slow test speed" patented technology

A fire resistance testing device for fire-resistant cables

This utility model relates to the field of cable testing technology, specifically a fire resistance testing device for fire-resistant cables. It includes a test platform with several lifting components fixedly mounted on it for adjusting the flame spray height. Each lifting component has a rotatable flame spray component mounted on it. A spring is installed between adjacent flame spray components. A gas supply pipe is connected to the rear end of each flame spray component. A fixing component is provided at the top of each lifting component. By setting up the lifting components, flame spray components, and fixing components, the lifting components drive the flame spray components and fixing components to move up and down synchronously, ensuring that each nozzle corresponds to a bent cable, guaranteeing uniform heating throughout the cable. This allows the test results to better reflect the cable's true fire resistance performance. Furthermore, when the cable shape needs to be changed, the cable shape can be altered by adjusting the height of each fixing component, eliminating the need to contact the cable or wait for it to cool down, thus improving testing safety and speed.
Owner:HENAN TONG CABLE

Test path planning apparatus, wafer testing apparatus and wafer testing method

This invention provides a test path planning apparatus, a wafer testing apparatus, and a wafer testing method. The test path planning apparatus includes a map acquisition module and an interpretation module. The map acquisition module provides a current test map corresponding to the current testing stage of the wafer based on the input product number and batch number. The current test map is a map image including multiple dies to be tested and multiple defective dies. The interpretation module is electrically connected to the map acquisition module and is used to acquire the current test map and use an interpretation model to determine the test fixture pattern and test path corresponding to the current test map.
Owner:NUVOTON