22results about How to "Solve the slow test speed" patented technology

The embodiment of the invention provides a testing device of a silicon-based photoelectric integrated chip, the silicon-based photoelectric integrated chip and a testing method of the silicon-based photoelectric integrated chip, and belongs to the technical field of chip testing. The test device comprises a tunable polarization-maintaining light source configured to output polarization-maintaining light; the first optical coupling link comprises a first polarization-maintaining optical splitter allowing polarization-maintaining light to pass through, an optical power meter, a single-channel array and an input port of a silicon-based photoelectric integrated chip; the second optical coupling link comprises a second polarization-maintaining optical splitter allowing polarization-maintaining light to pass through, at least two polarization-maintaining optical circulators, an optical power meter, a multi-channel array and at least two polarization-maintaining light output ports of a silicon-based photoelectric integrated chip; and the 1 * 2 polarization-maintaining optical switch is configured to switch polarization-maintaining light between the first optical coupling link and the second optical coupling link. According to the testing device, time domain multiplexing of optical path coupling and parameter measurement in the same optical path system is achieved, and alignment of a chip port and an optical fiber array and evaluation of chip performance parameters are completed at a time.

The invention discloses an automatic testing method and device for the number of connectable users of user front-end equipment, and the method comprises the steps: generating a plurality of virtual users, and configuring a unique MAC address for each virtual user; a first message is constructed according to the MAC address of each virtual user, all first messages are sent to a network in a multi-thread mode, and the first message comprises the requested IP address; monitoring and collecting a second message sent by the user front-end equipment, the second message being sent by the user front-end equipment after the user front-end equipment receives the first message, and the second message comprising the requested IP address; extracting the requested IP addresses in all the second messages and counting the number of the extracted requested IP addresses; and obtaining a test result according to the number of the extracted requested IP addresses and a preset number threshold. According to the invention, efficient and automatic testing of the CPE equipment in a multi-user environment is realized, and the testing speed and precision are greatly improved.

The invention relates to the technical field of elevator braking tests, in particular to a remote control elevator load braking test device and a using method thereof.The remote control elevator load braking test device comprises a vehicle body, a control mechanism is arranged in the vehicle body and comprises an electric telescopic rod parallel to the top of the vehicle body, and the control mechanism is fixedly connected with a material taking mechanism; the material taking mechanism comprises a fixing pipe, and an adjusting mechanism is arranged in the fixing pipe. The position of the material taking mechanism is changed through the control mechanism, weights on the other intelligent trolley are flexibly taken in cooperation with the adjusting mechanism, a U-shaped limiting groove enables a sliding column to horizontally rotate and vertically move under the condition that the moving direction of an electric telescopic rod is not changed, the adjusting mechanism is triggered in the downward moving process of the sliding column, and the weights on the other intelligent trolley are taken out. The sliding block and the first clamping groove are clamped or separated, the placing number of weights is selected according to the test requirement, the braking state of the elevator under the condition of different loads is tested, and different load tests can be conducted on the two elevators at the same time under the condition that the two intelligent trolleys load the weights.

This utility model relates to the field of cable testing technology, specifically a fire resistance testing device for fire-resistant cables. It includes a test platform with several lifting components fixedly mounted on it for adjusting the flame spray height. Each lifting component has a rotatable flame spray component mounted on it. A spring is installed between adjacent flame spray components. A gas supply pipe is connected to the rear end of each flame spray component. A fixing component is provided at the top of each lifting component. By setting up the lifting components, flame spray components, and fixing components, the lifting components drive the flame spray components and fixing components to move up and down synchronously, ensuring that each nozzle corresponds to a bent cable, guaranteeing uniform heating throughout the cable. This allows the test results to better reflect the cable's true fire resistance performance. Furthermore, when the cable shape needs to be changed, the cable shape can be altered by adjusting the height of each fixing component, eliminating the need to contact the cable or wait for it to cool down, thus improving testing safety and speed.

A signal processing module test system comprises a power supply unit, a main control unit, a signal generator unit, a communication unit, an analog voltage acquisition unit, an input channel switching unit and an output channel switching unit. The single-chip microcomputer of the main control unit is correspondingly connected with the relays of the input channel switching unit and the output channel switching unit through a Darlington transistor driver. The input end of the signal generator unit is connected with three output pins of the single-chip microcomputer in a one-to-one correspondence mode, and the output end of the signal generator unit is connected with the signal input end of a to-be-tested signal processing module through the input channel switching unit. The input end of the analog voltage acquisition unit is connected with the output end of the to-be-tested signal processing module through the output channel switching unit, and the output end of the analog voltage acquisition unit is correspondingly connected with the input pins of the single-chip microcomputer. And the communication unit is correspondingly connected with an output pin of the main control unit and is used for uploading the acquired voltage signal and the time signal to an upper computer. The system is high in test speed and high in test precision.

The invention discloses a blood sample analyzer and a rapid sample analysis system and method. The blood sample analyzer comprises a sampling needle, an RBC / HGB test solution preparation pool and at least two DIFF pools. Blood sample collection and separate injection are completed through the sampling needle, the number of the reaction units is strictly controlled, the occupied time of the sampling needle for executing sample separate injection to the reaction units is correspondingly shortened, continuous and rapid detection of constant blood samples and trace blood samples is achieved, and the highest detection speed is larger than or equal to 200 T / h. Meanwhile, the blood sample analyzer is low in sample consumption demand, and the consumption of the required reaction reagent can be reduced along with the reduction of the sample size, so that the detection cost can be reduced. Meanwhile, the optical detector only carries out DIFF channel detection once, the flow of sample liquid can be controlled to be below 8uL / s, the pressure of sheath liquid needing to be matched can be less than 120kpa, and the problems of high process difficulty and high cost of existing rapid blood analysis are well solved.

The invention relates to the technical field of thermal resistance rapid measuring devices, in particular to a thermal resistance rapid measuring device which comprises a machining plate seat, a through groove is formed in the surface of the machining plate seat, a movable accessory is movably installed in the through groove and comprises a movable plate, and a motor is installed on the surface of the movable plate through a limiting accessory. The motor frequency converter end is provided with a first wire harness butt joint module, the right side of the first wire harness butt joint module is provided with two alternating current contactors, and the right sides of the alternating current contactors are connected with a double-arm bridge tester through wire harnesses. Before the motor operates, the first button switch is pressed, the first alternating current contactor pulls in the motor to operate for a temperature rise test, after the temperature rise is finished, the motor is completely stopped, the second button switch is pressed, the first alternating current contactor is disconnected, the power supply side is disconnected, the second alternating current contactor is pulled in, the thermal resistance can be directly measured, and at the moment, the stopwatch starts timing; and recording data.

The invention discloses a connector Pin height testing device, which belongs to the technical field of Pin height testing and comprises a supporting bottom frame, a fixed detection table is arranged on the supporting bottom frame, and a product placing track is fixed on the fixed detection table. According to the invention, for the detection of the Pin height of a small connector with a small number of Pins, the space required by a test device can be reduced, the cost required by the device is reduced, the technical difficulty required by the device is reduced, and the height data of the Pin can be obtained; the material pressing plate with the profiling pressing block is arranged on the lower surface of the lifting plate; before a product is tested, a profiling pressing block is used for pressing the back face of a Pin needle on the back face of the product, the perpendicularity of the product and the tested Pin needle can be guaranteed by pressing the product, the Pin needle of the product is avoided to prevent the pressing block from being in contact with the product to influence the state of the Pin needle of the product, the detection accuracy is guaranteed, all the Pin needles can be completely sensed in the testing process through the arranged detection module and the arranged auxiliary Pin needle, and the testing efficiency is improved. And meanwhile, the test Pin can be quickly rebounded, so that the test speed is increased.

This invention provides a test path planning apparatus, a wafer testing apparatus, and a wafer testing method. The test path planning apparatus includes a map acquisition module and an interpretation module. The map acquisition module provides a current test map corresponding to the current testing stage of the wafer based on the input product number and batch number. The current test map is a map image including multiple dies to be tested and multiple defective dies. The interpretation module is electrically connected to the map acquisition module and is used to acquire the current test map and use an interpretation model to determine the test fixture pattern and test path corresponding to the current test map.

The invention belongs to the technical field of chip testing, and particularly relates to optical module chip automatic testing equipment which comprises a workbench. The workbench is connected with a feeding part used for conveying a material disc, a positioning grabbing part used for grabbing a workpiece in the material disc, a second camera used for correcting the position of the workpiece, a testing alignment assembly used for adjusting the testing position of the workpiece, a testing assembly used for testing the workpiece and an overturning assembly used for overturning the workpiece. According to the invention, automatic testing of the optical power of the optical module chip can be realized, continuous testing can be realized, manual intervention is not needed, dependence on high-skill operators is reduced, labor cost is reduced, rejection rate caused by human errors is reduced, testing speed and efficiency are greatly improved, highly accurate and consistent testing results are provided, and the testing efficiency is improved. The performance of each optical module chip can be ensured to reach a predetermined standard, and the quality and the reliability of a final product are improved.

The present invention discloses a fixture for thermal resistance testing of SMD packaged semiconductor devices, including a protective shell, a top end of the inner wall of the protective shell is fixedly connected with an annular plate, the inner part of the annular plate is rotatably connected with a test disk, and the surface of the test disk is evenly provided with three test slots. The present invention is provided with a driving device, which can realize automatic loading and automatic testing of the fixture, so that the thermal resistance test of the SMD packaged semiconductor device forms a complete assembly line, the automation degree of the test process is high, and the convenience and test speed of the fixture when performing thermal resistance testing can be effectively improved; by providing a matching detection device, when the fixture performs thermal resistance testing on the SMD packaged semiconductor device, the SMD packaged semiconductor device can be automatically pressed against the central part of the surface of the test device, which is convenient for the test device to perform thermal resistance testing on the SMD packaged semiconductor device, and can further improve the convenience of using the fixture.

The invention belongs to the technical field of antenna spherical surface near-field testing, and provides an antenna spherical surface near-field testing method and system based on electric control multiple probes, and the method comprises the steps: obtaining an antenna spherical surface near-field testing scene and testing demands, generating a test sequence comprising a frequency control sequence and a wave position control sequence; controlling the frequency of the microwave signal output by each probe, so that the frequency of the microwave signal output by each probe at the same moment is the same; for each specific frequency point, controlling the amplitude and phase of the microwave signal output by each probe; performing beam forming to obtain an equivalent emission pointing beam under a specific frequency point, and performing radiation of a tested target antenna in sequence to complete antenna spherical near-field testing of the tested target under the specific frequency point; and the frequency is changed through the frequency control sequence, and the antenna spherical near-field test of the tested target under different frequency points meeting the test scene and the test requirement is realized.

The present application discloses a chip testing technology field, specifically an optical module chip automatic testing device, including a workbench, the workbench is connected with a feeding part for conveying a material tray, a positioning and grasping part for grasping a workpiece in the material tray, a camera 2 for correcting the position of the workpiece, a test alignment component for adjusting the test position of the workpiece, a test component for testing the workpiece, and a flipping component for turning the workpiece over; the automatic testing of the optical power of the optical module chip can be realized, the testing can be carried out continuously without human intervention, the dependence on highly skilled operators is reduced, the labor cost is reduced, the scrap rate caused by human errors is reduced, the testing speed and efficiency are greatly improved, and highly accurate and consistent test results are provided, which helps to ensure that the performance of each optical module chip meets the predetermined standards and improve the quality and reliability of the final product.

The invention relates to the field of RF desensitization testing, in particular to RF desensitization automatic testing equipment and a testing method thereof, and the testing equipment comprises a baseband signal source module which is used for generating baseband digital or low-frequency voice signals with different waveforms such as analog AM / FM, digital FSK and PSK; the up-conversion unit is used for realizing frequency conversion of a higher-frequency radio-frequency signal; the audio signal analysis module is used for carrying out accurate frequency response measurement and detailed harmonic distortion analysis; the system also comprises a related communication interface module and an excitation antenna. The test method comprises the following specific steps: S1, setting a channel; s2, receiving a signal; s3, recording data; s4, recording a result; s5, repeating; s6, importing data; after the RF desensitization automatic test equipment is connected with the airborne equipment interface through the test interface, the system is automatically controlled to work by using the control instruction, so that the RF desensitization characteristic automatic test of the tested airborne radio frequency equipment is realized, and the test speed and precision of the system are improved.

The present invention proposes a method and system for distinguishing the fault type of a power transmission line based on a capsule network. By acquiring a large amount of PMU (Phasor Measurement Unit) data, the PMU data is graphically generated into a radar chart; a power transmission line fault type distinction model based on a capsule network is constructed, a training set and a test set are divided, the training set is input into the model for training, and the change characteristics of the graphical PMU data are extracted; the test set is input into the trained model for testing, and the test results are classified and output in the form of a confusion matrix; the fault type of the transmission line is distinguished. The present invention does not require logical reasoning, nor does it require the introduction of a large amount of knowledge describing the behavior of the protection system. It only needs to extract the features corresponding to different fault types from the graphical PMU data. The modeling and model modification process is simple and easy to operate, the PMU data is graphically generated, computing resources are saved, the model training and testing speed is fast, and the diagnostic accuracy is relatively high.

The invention belongs to the technical field of air tightness and loading capacity testing, and discloses a water pressure testing method. The water pressure testing method comprises the following steps: connecting internal water channels of a plurality of workpieces to be tested in series through pipelines; one end of the pipeline is communicated with the flushing device, the other end of the pipeline is communicated with a water outlet pipe, and a switch valve is arranged at the water outlet pipe; closing the switch valve, and performing water pressure detection; carrying out a pressure maintaining test; and discharging water in the plurality of to-be-detected workpieces and the pipeline. By using the water pressure testing method in the embodiment, the flushing speed is high, the efficiency is high, water can be rapidly drained, and the detection efficiency is improved.

The invention provides a distributed control system detection method and device, equipment and a medium, the detection method is applied to the detection equipment, and the detection method comprises the following steps: obtaining a plurality of detection tasks corresponding to a to-be-detected module in a distributed control system; wherein the detection task is used for representing a task requirement for detecting the to-be-detected module; based on the detection task, performing network communication between the detection equipment and the to-be-detected module, and obtaining an actual output quantity through processing of the to-be-detected module; based on the actual output quantity and a preset output condition, obtaining an initial detection result corresponding to each detection task; and obtaining a target detection result corresponding to the to-be-detected module based on the initial detection result. Through network communication with the to-be-detected module in the distributed control system, detection data acquisition of the distributed operation system is realized, the test speed and the action execution efficiency are improved, the occurrence frequency of human errors is reduced, and the accuracy and the reliability of a detection result are ensured.

The invention provides a chip verification test method, a chip test device, electronic equipment and a storage medium, and the method comprises the steps: constructing a plurality of test branches according to a plurality of to-be-tested chips and the chip test device; in this way, the plurality of to-be-tested chips are inserted into the chip device to construct the plurality of test branches, so that the plurality of test branches can be tested synchronously, the test efficiency and the test speed are improved, and the test time is shortened. The method comprises the following steps: firstly, carrying out preliminary test on a plurality of test branches in a test process, and determining target test moments of a plurality of chips to be tested; at the target test moment, carrying out fault test on the plurality of test branches to obtain a test result of each to-be-tested chip; and then determining a fault chip according to the test result of each to-be-tested chip. Therefore, by analyzing the test results of the to-be-tested chips, the fault chips in the to-be-tested chips can be determined, and the chip test efficiency is improved.

The utility model relates to the technical field of illumination, and discloses a dimming curve test device, which comprises a test box, a shading cylinder, an illuminance collector, a turntable and a driver, the front side surface of the test box is provided with a light through hole, the first end of the shading cylinder is connected with the light through hole, the second end of the shading cylinder is connected with a tested lamp, the turntable is provided with a convex lens and a light through diaphragm, and the light through diaphragm is connected with the light through hole. The illuminance collector and the rotating disc are arranged in the test box, the driver is installed in the test box, the output end of the driver is connected with the rotating disc and can drive the rotating disc to rotate, and the rotating disc is arranged on the front side of the illuminance collector. The probe axis of the illuminance collector, the axis of the convex lens or the axis of the light-passing diaphragm, the axis of the shading cylinder and the light-emitting axis of the tested lamp coincide. According to the utility model, a high-brightness dimming curve and a low-brightness dimming curve can be measured, the influence of ambient light can be eliminated, and the test speed and the measurement precision are improved.

The invention belongs to the technical field of high-frequency load boards, and particularly relates to a high-frequency load board suitable for a radio frequency integrated circuit testing machine and a fastening device of the high-frequency load board. Installing a plurality of blind matching A joints; in the blind matching A connector, a floating body is located in a connector shell, an elastic piece is installed between the floating body and the connector shell, a core body penetrates through the middle of the connector shell and the floating body, and a floating head is fixedly installed on the outer side of the core body. A columnar second cavity is formed in the middle of the side, away from the floating head, of the floating body. The initial length of the elastic piece is equal to the sum of the height of the second cavity and the designed floating stroke of the blind matching A connector. Compared with the prior art, the invention has the beneficial effects that a plurality of blind-match joints with the frequency up to 44GHz are designed on the load board, and the test frequency, the test channel and the test function of the load board are provided; the floating stroke of the blind matching connector is designed, the whole load board moves downwards synchronously when the fastening device is matched for fastening, multi-channel accurate butt joint is achieved, and the testing efficiency and the testing speed of the radio frequency integrated circuit in batch and high-frequency testing are improved.

The utility model relates to the technical field of resonator testing, and provides a quartz crystal resonator crystal testing machine which comprises a machine frame, a plurality of conveying shafts, a conveying belt, a fixing plate, a testing plate, a pushing frame, a moving mechanism and a testing mechanism, the conveying shafts are arranged in the machine frame in a rotating mode, the conveying belt is arranged among the conveying shafts in a transmission mode, and the fixing plate is arranged on the conveying belt. The conveying belt is arranged on the rack, the fixing plates are fixedly connected to the conveying belt, the two testing plates are arranged on the rack, the pushing frame is arranged on the rack, the moving mechanism is arranged on the rack and used for driving the conveying belt to move intermittently, the testing mechanism is arranged on the rack and used for detecting the quartz crystal resonator, and the conveying belt is arranged on the rack and used for conveying the quartz crystal resonator. According to the technical scheme, the problems that in the prior art, an operator needs to frequently disassemble the quartz crystal resonator, time and labor are wasted, and the testing efficiency is reduced are solved.