Double-CPU multichannel FT mass production test system and method

Abstract

The invention discloses a double-CPU multichannel FT mass production test system and method. The system comprises a human-machine interface processing module, a handler control module, an open/short circuit detection module, a data storage module, a power control module, a test module, a statistical analysis module and an LCD touch display module, wherein the handler control module, the open/shortcircuit detection module, the data storage module, the power control module, the test module and the statistical analysis module are arranged in an ARM processor, and the human-machine processing module and the LCD touch display module are arranged in an LCD touch display unit. Through the test system and method, testing speed and data processing speed are greatly increased, the test system and method are not limited by the influence of an application terminal, data accuracy and repeated testing are realized, working efficiency is high, and the test system and method are beneficial for controlling batch delivery quality of products.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a system and a method for chip simulation performance testing, data statistics and analysis, and client programming. Background technique [0002] At present, the existing single-board mass-production testing device cannot simultaneously control and test multiple Handlers at the same time, and cannot automatically test multiple indicators such as voltage, current, clock frequency, and pull-down resistance. Realization, poor flexibility and high investment, often due to problems such as long-term contact, the indicators of the chip cannot be accurately tested, and in serious cases, indicator misjudgments may occur; when there is a problem with the performance of the chip, the testing equipment does not have a complete set of testing The method cannot perform statistical analysis at the same time, and the test results will be misjudged due to problems such as false cont...

AI Technical Summary

Problems solved by technology

[0002] At present, the existing single-board mass-production testing device cannot simultaneously control and test multiple Handlers at the same time, and cannot automatically test multiple indicators such as voltage, current, clock frequency, and pull-down resistance. Realization, poor flexibility and high investment, often due to problems such as long-term contact, the indicators of the chip cannot be accurately tested, and in serious cases, indicator misjudgments may occur; when there is a problem with the performance of the chip, the testing equipment does not have a complete set of testing The method cannot perform statistical analysis at the same time, and the test results will be misjudged due to problems such as false contact between the chip and the handler; the test data of the tested chip cannot be saved in real time, which will bring difficulties to the subsequent analysis of chip index items; Due to the lack of adaptive power control and clamping functions, the chip cannot be calibrated to the proper level, and the output voltage is unstable, resulting in low feasibility of test data; testing of different types of projects requires the development of new test platforms, and the platform has poor versatility. The new test device has a long cycle and cannot meet the needs of FT mas...

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