Particle Analysis Apparatus And Production Method Thereof
A particle analysis, particle technology, applied in the field of particle analysis devices
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[0057] In the particle analysis device of the present invention, conventional complicated components for an optical system are not used on the light source side, but a light beam is formed through a small light-transmitting hole formed in an opaque film, and the light beam reaches an illumination point. With such a configuration on the light source side, many parts in the optical system are omitted to enable miniaturization of the entire device, and also reduce the cost of the parts.
[0058] In addition, since the optical path of the light beam is determined by the position of the light-transmitting hole formed in the opaque film, it is possible to align the position irradiated by the light beam in the flow channel with high precision. Therefore, steps of alignment and focusing of irradiation light by many optical system components can be omitted, and assembly costs can also be reduced.
[0059] Regarding the photodetector side, in the embodiment in which the flow channel is ...
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