An Analytical Method for Measuring the Texture of Large Grain Silicon Steel

An analysis method and large-grain technology, which is applied in the analysis of materials, material analysis using wave/particle radiation, image analysis, etc., can solve the problems that cannot be used to draw the inverse pole diagram of large-grain silicon steel samples

Inactive Publication Date: 2016-09-21
武汉钢铁有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, the traditional measurement method cannot be used to draw the inverse pole figure of the large grain silicon steel sample

Method used

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  • An Analytical Method for Measuring the Texture of Large Grain Silicon Steel
  • An Analytical Method for Measuring the Texture of Large Grain Silicon Steel

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Embodiment Construction

[0013] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments, but these embodiments should not be construed as limiting the present invention.

[0014] In a specific embodiment of the present invention: since the surface to be tested of the silicon steel plate must be a flat surface, it meets the requirements of the electron backscattered diffraction test after polishing and other pretreatments. Then cut a piece of large-grained silicon steel of 300mm×30mm to be the area to be tested for the electron backscattered diffraction sample.

[0015] Such as figure 1 As shown in , mark the grain boundaries with a marker pen to divide each grain; the marked grains are numbered from 1 to 48 in sequence.

[0016] Take this sample into a photo, and use an image analyzer to measure the area of ​​each grain in the photo: A 1 to A 48 .

[0017] Calculate A 0 the size of:

[0018] When surveying and mapping, the {hk...

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Abstract

The invention discloses an analysis method for measuring the texture of large-grain silicon steel, which comprises the following steps: 1. Making the silicon steel plate into a sample to be tested by electron backscatter diffraction; 2. Cutting out the sample to be tested by electron backscatter diffraction Measure the area, and distinguish each grain in the area to be tested according to the grain boundary; 3. Calculate the area A of each grain m and the area A of the sample's total area to be tested 总 ; Four, non-textured treatment, calculate the proportion A of a single grain in the area to be tested 0 Five, test its grain orientation (hkl) with electron backscatter diffraction in each crystal grain and get its absolute value; Six, put A m divide by A 总 The resulting value, then divided by A 0 value, that is, the relative polar density P (hkl) ; Seven, the relative pole density P (hkl) Marked on the position of the corresponding crystal plane in the inverse pole diagram. The invention has the characteristics of establishing a correct corresponding relationship between test results and material properties, and can be widely used in the field of large-grain material testing.

Description

technical field [0001] The invention relates to a test method for large-grain materials, in particular to an analysis method for measuring the texture of large-grain silicon steel. Background technique [0002] Due to the limitation of the external environment, the crystalline substance fails to develop into crystals with regular shapes, but only crystallizes into granules, forming grains. A polycrystal is often formed by a collection of multiple single crystals. If the number of crystal grains is large and the arrangement of each crystal grain is completely random and statistically uniform, that is, the probability of orientation in different directions is the same, the polycrystalline aggregate will be in different directions. It will macroscopically show various phenomena with the same performance. During the formation process, due to the influence of various environments or processing techniques such as external force, heat, electricity, and magnetism, the crystal grain...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/203G06F19/00G06T7/00
Inventor 周顺兵王志奋吴立新陈士华姚中海
Owner 武汉钢铁有限公司
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