Mask evaluation method and mask structure code pattern of coded mask optical imaging system

An optical imaging system and evaluation method technology, applied in the field of coding mask optical imaging system, can solve the problems of complicated process and large amount of calculation, and achieve the effect of avoiding operation errors and avoiding replacement operations.

Inactive Publication Date: 2017-06-20
TIANJIN UNIV
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Problems solved by technology

This method has a clear goal, but it needs to complete the whole process of the original scene passing through the optical system, being collected by the detector, and finally restored to an image. The process is complicated and the amount of calculation is large.

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  • Mask evaluation method and mask structure code pattern of coded mask optical imaging system
  • Mask evaluation method and mask structure code pattern of coded mask optical imaging system
  • Mask evaluation method and mask structure code pattern of coded mask optical imaging system

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Embodiment Construction

[0039]The mask evaluation method and mask structure code pattern of the coded mask optical imaging system of the present invention will be described in detail below with reference to the embodiments and the accompanying drawings.

[0040] The mask evaluation method of the coded mask optical imaging system of the present invention is based on the action principle of the point spread function in the imaging system on the final imaging quality, and takes the point spread function of the coded mask imaging system as the evaluation object. and trends to judge the imaging performance of a pattern.

[0041] A mask evaluation method for an coded mask optical imaging system, including three evaluation indicators: M1, M2 and RA, and the three evaluation indicators are all in a certain area with a point spread function h(x, y). The concentrated energy size is the calculation object, specifically:

[0042] The evaluation index formula M1(r) means: take the imaging center of the inciden...

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Abstract

The invention provides a mask evaluation method for a coded mask optical imaging system and a mask structure code pattern. The mask evaluation method relates to three evaluation indexes including M1, M2 and RA. According to the mask structure code pattern, periodic arrangement is conducted on multiple square units which are completely identical in structure and meet the requirements of the Dammann optical grating structure, and then the square array structure is formed. The square array structure is an N*N array, wherein N is a positive integer and is larger than or equal to 3. By the adoption of the mask evaluation method for the coded mask optical imaging system and the mask structure code pattern, the coded mask optical imaging system is described based on the mask structure and the characteristics of a lens assembly, the point spread function of the system can be obtained more rapidly and more conveniently, the preparation process of manufacturing, construction and debugging of a real system is omitted, and operation errors possibly caused during actual measurement are avoided; the regulation function of different code pattern structures on the point spread function of the coded mask optical imaging system can be described objectively and can be used as the evaluation basis of the influence of the code pattern structures on the imaging quality of the whole system, and finally instructive suggestions are provided for design and optimization of the code pattern of coded masks of such imaging systems.

Description

technical field [0001] The present invention relates to a coding mask optical imaging system. In particular, it relates to a mask evaluation method and a mask structure code pattern of a coded mask optical imaging system. Background technique [0002] The coded mask imaging system originated from the detection and imaging process of X-ray and other heavy particle rays. Since the heavy particle rays radiated from long distances cannot be focused on the detector by the traditional optical lens system, a coding mask with a certain pattern structure is used to modulate the heavy particle rays reaching the detection system, and it is necessary to coordinate the detection results. The corresponding image decoding technology is used to restore and image the original heavy particle radiation source scene. (E.E. Fenimore, and T.M. Cannon, "Coded aperture imaging with uniformly redundant arrays," ApplOptics 17, 337-347 (1978)). [0003] Today, coded mask imaging technology has been...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F19/00G01M11/02
Inventor 张傲汪清金杰杨敬钰孙懿
Owner TIANJIN UNIV
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