A Self-Triggering Method for Detecting Particle Accelerator Beam Abnormalities

Abstract

The present invention provides a self-triggering method for detecting beam abnormality of a particle accelerator, comprising: Step S1, 2 buttons of a button-type beam position probe N The electrode induction signal of each electrode is subjected to signal conditioning, sampling and digital signal processing, to obtain the turn-by-turn signal; step S2, obtain the sum signal of the turn-by-turn signal in each period; calculate the difference value of the sum signal of adjacent periods, and judge Whether the difference reaches the preset threshold value, if it reaches the first trigger signal is output; step S3, select the circle-by-turn signal of the diagonal electrode to perform difference ratio sum operation; step S4, perform discrete Fourier operation on the difference ratio sum result to obtain Obtaining the beam current spectrum, judging whether the beam current spectrum in the predetermined frequency band is consistent with the preset standard spectrum, and outputting a second trigger signal if they are not consistent. The present invention can accurately and timely detect known events and instantaneous random abnormal events without external trigger signals, and provide corresponding trigger signals, thereby greatly improving data collection efficiency and intelligent level.

Description

technical field [0001] The invention relates to the field of accelerator physical beam diagnosis, and in particular designs a self-triggering method for detecting abnormality of particle accelerator beams. Background technique [0002] The beam measurement system is a very important part of the accelerator, and it plays a vital role in the machine research and normal operation of the accelerator. Among them, the beam position measurement system is one of the most important devices in the beam diagnosis, and it mainly consists of two parts: the button-type beam position probe at the front end and the beam position signal processor at the back end. [0003] Such as figure 1 As shown, the beam position probe generally includes a vacuum chamber and four electrodes A, B, C and D symmetrically arranged on both sides of the vacuum chamber. The four electrodes output induction signals when the beam passes through the probe, and the induction signals are output to the beam position...

AI Technical Summary

Problems solved by technology

However, when instantaneous and random abnormal events occur in the operation of the particle accelerator, such as beam drop, beam spectrum anomaly, etc., the signal processor in the external trigger mode cannot automatically capture the beam data before and after the anomaly for researchers to carry out machine analysis. research, resulting in the loss of valuable data

In summary, the processor's dependence on external trigger signals limits its application value in machine operation and research

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