Unlock instant, AI-driven research and patent intelligence for your innovation.

Test module

A test module and test disk technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of time-consuming, product schedule impact, and reduce testers' income, and achieve the effect of increasing income and reducing working hours.

Inactive Publication Date: 2014-12-03
INNOVATIVE TURNKEY SOLUTION
View PDF6 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, there are many dies on the test tray, which are picked up by the robot arm to the inspection mechanism for inspection one by one. It takes a lot of man-hours, and it will reduce the testers’ The income will also affect the progress of subsequent products

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test module
  • Test module
  • Test module

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] In order to make the purpose, technical features and advantages of the present invention better understood by those skilled in the art and to implement the present invention, the technical features and implementation methods of the present invention will be explained in the following description with reference to the accompanying drawings, and comparative examples will be listed. The preferred embodiments are further described, but the following descriptions of the embodiments are not intended to limit the present invention, and the accompanying drawings below are schematic representations related to the characteristics of the present invention.

[0017] First, see figure 2 , is a top view of the test module on the test bench of the present invention. like figure 2 As shown, the test bench 2 on the chip testing machine of the present invention includes a test module 1, which includes a test disc 10 (tray) and a test substrate 20; Surface 103: a plurality of placemen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test module which comprises a test tray and a test substrate. Conductors on the test tray are used, so that the test substrate of a chip tester can align all chips in one time; and detection is performed synchronously, thereby reducing a large amount of working time in a test process, improving benefit of a tester and generating a positive benefit for process of a subsequent product.

Description

technical field [0001] The present invention relates to a test module, in particular to a test disc for a large number of test chips. Background technique [0002] In recent years, with the advancement of electronic technology, network and other related technologies, and the improvement of the consumption level of the global electronic market, the demand for electronic products such as personal computers, multimedia, workstations, networks, and communication-related equipment has surged, driving the entire world semiconductor industry. flourishing. [0003] Manufacturing an integrated circuit chip (IC chip) from a silicon wafer requires a multi-channel process, including: product design (IC design), wafer manufacturing (Wafer manufacture), mask (Photo mask) ) manufacturing, IC packaging (Packaging), testing (Testing), packaging (Assembly), and peripheral lead frame manufacturing (Lead-frame manufacture), connector manufacturing (Connector manufacture), circuit board manufac...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/02
Inventor 陈石矶
Owner INNOVATIVE TURNKEY SOLUTION