A method for allocating failure rate of each subsystem in satellite design process

Abstract

The invention discloses a method for distributing subsystem failure rates in the satellite design process. The subsystem number, the subsystem device number, equipment inheritance categories and other information in satellite design parameters are utilized, the complex rates, the inheriting degrees, the same platform satellite ontrack failure conditions, task time lengths and the development period lengths of satellite subsystems are comprehensively and quantitatively compared, the distribution factors of the subsystems are calculated, and the reliability requirements of a user for the overall satellite are reasonably distributed to the subsystems. The method is put forward by the machine heat engineering department of the Spaceflight East Red Satellite Co. Limited, and is preliminarily used and popularized in a plurality of satellites, index distribution is reasonable and accurate, and large secondary adjustment is not carried out on indexes in the development process. Through the method, the reliability index requirements of the overall satellite for the subsystems meet the actual condition of composite product engineering development better, reliability improvement of products is facilitated better, and implementation of the reliability target of the overall satellite is guaranteed.

Description

technical field [0001] The invention relates to a method for allocating failure rates of subsystems in the satellite design process, and belongs to the technical field of overall satellite design. Background technique [0002] Reliability index is a quantitative representation of product reliability requirements, and reliability index allocation is an important link in system reliability design. In the field of aerospace, the user generally puts forward the reliability index requirements of the satellite as a whole, and the satellite overall then decomposes the user's index and distributes it to each subsystem, equipment and lower-level products. [0003] At present, the overall reliability allocation of domestic satellites mainly adopts the similar product method, an empirical method, that is, referring to the reliability allocation of launched satellites, and then making slight modifications based on the actual situation. In the actual allocation process, there is neither...

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Problems solved by technology

[0005] To sum up, at present, the distribution of domestic satellite reliability indicators is seriously out of touch with product development, reliability allocation is too subjective, there are no mature mathematical models and calculation formulas, and the requirements of assigned reliability indicators are not very binding on product design. There is basically no binding force on the reliability growth of products

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