Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optical fiber backscattering measurement method and device based on spread spectrum technology

A technology of backscattering and optical fiber, which is applied in the field of photoelectric detection, can solve the problems that light backscattering measurement cannot take into account the measurement accuracy and dynamic range, and achieve the effect of improving performance, improving dynamic range, and overcoming electronic bottlenecks

Active Publication Date: 2015-01-07
李卫
View PDF2 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Existing light backscattering measurements cannot balance measurement accuracy and dynamic range well
The application of spread spectrum technology in these fields has good prospects in theory, but it faces the technical problem of how to realize bipolar codes in the optical domain and despreading in the optical domain

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optical fiber backscattering measurement method and device based on spread spectrum technology
  • Optical fiber backscattering measurement method and device based on spread spectrum technology
  • Optical fiber backscattering measurement method and device based on spread spectrum technology

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0031] Aiming at the deficiencies of the prior art, the object of the present invention is to provide a light backscattering measurement based on spread spectrum technology, and the implementation cost is low.

[0032] The purpose of the present invention is to achieve through the following technical measures:

[0033] First, the transmission sequence is modulated into optical phase information by using the optical differential phase-shift key modulation format (DPSK), and sent to the optical path to be tested.

[0034] Optical differential phase shift keying modulation format is a new type of transmission technology in optical communication. The modulation principle of optical DPSK is to transmit information by using the optical carrier phase difference of adjacent bits. The transmission sequence is differentially precoded first, and then phase modulated. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an optical fiber backscattering measurement method and device based on the spread spectrum technology. The method comprises the steps that a sending sequence carries out phase modulation on light source signals through DPSK modulation; DPSK optical signals generated after phase modulation enter an optical path to be measured; DPSK optical signals reflected or backscattered from the optical path to be measured enter a delay interferometer through a first optical directional coupler or an optical circulator, so that demodulation of the DPSK optical signals is achieved; photovoltaic conversion is carried out on the demodulated DPSK optical signals; related despreading is carried out on signals generated after photovoltaic conversion through the local sequence so that optical backscattering measurement can be carried out. According to the optical fiber backscattering measurement method and device based on the spread spectrum technology, by combining the DPSK modulation technology with the spread spectrum technology, the bipolarity of optical domain spreading codes is achieved, the accuracy of optical fiber backscattering measurement is improved, and the dynamic range of optical fiber backscattering measurement is expanded; by modulating the phase of the delay interferometer, code element multiplication in related despreading is achieved, and the electronic bottleneck in electric domain related despreading is overcome.

Description

technical field [0001] The invention relates to photoelectric detection technology, in particular to a method and device for measuring optical fiber backscattering based on spread spectrum technology. Background technique [0002] Scattering signals in optical fibers mainly include Rayleigh scattering, Raman scattering and Brillouin scattering. Optical fiber backscattering measurement is a method of measuring various scattering and Fresnel reflections at the light emitting end when light is transmitted in the optical fiber through certain positioning technology. [0003] Fiber optic backscatter measurements have two major application areas in the market today. One is to measure the link loss, insertion point loss and fault point location of the optical fiber, which is mainly realized by measuring the back Rayleigh scattering and Fresnel reflection of each point in the optical fiber; the second is mainly by measuring the back Raman scattering or back Brillouin scattering, u...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J1/04G01J5/08H04B10/071H04B10/556
Inventor 李卫
Owner 李卫
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com